1995 |
3 | EE | J. A. Segura,
M. Roca,
D. Mateo,
A. Rubio:
An approach to dynamic power consumption current testing of CMOS ICs.
VTS 1995: 95-100 |
1992 |
2 | EE | J. A. Segura,
Víctor H. Champac,
Rosa Rodríguez-Montañés,
Joan Figueras,
J. A. Rubio:
Quiescent current analysis and experimentation of defective CMOS circuits.
J. Electronic Testing 3(4): 337-348 (1992) |
1991 |
1 | | Rosa Rodríguez-Montañés,
J. A. Segura,
Víctor H. Champac,
Joan Figueras,
J. A. Rubio:
Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS.
ITC 1991: 510-519 |