2006 |
14 | EE | Ali Chehab,
Saurabh Patel,
Rafic Z. Makki:
Scaling of iDDT Test Methods for Random Logic Circuits.
J. Electronic Testing 22(1): 11-22 (2006) |
2004 |
13 | EE | Scott Thomas,
Rafic Z. Makki,
Sai Kishore Vavilala:
Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing.
DELTA 2004: 195-202 |
2002 |
12 | EE | Suriya Ashok Kumar,
Rafic Z. Makki,
David Binkley:
IDDT Testing of Embedded CMOS SRAMs.
DATE 2002: 1117 |
11 | EE | Ali Chehab,
Rafic Z. Makki,
Michael Spica,
David Wu:
IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits.
DELTA 2002: 403-407 |
2000 |
10 | EE | Jian Liu,
Rafic Z. Makki,
Ayman I. Kayssi:
Dynamic Power Supply Current Testing of CMOS SRAMs.
J. Electronic Testing 16(5): 499-511 (2000) |
1998 |
9 | EE | Jian Liu,
Rafic Z. Makki,
Ayman I. Kayssi:
Dynamic Power Supply Current Testing of SRAMs.
Asian Test Symposium 1998: 348-353 |
8 | EE | Rafic Z. Makki:
Testing of Embedded Memories - The Aggregate.
Asian Test Symposium 1998: 519 |
1995 |
7 | EE | Jian Liu,
Rafic Z. Makki:
Power supply current detectability of SRAM defects.
Asian Test Symposium 1995: 367- |
6 | | Rafic Z. Makki,
Shyang-Tai Su,
Troy Nagle:
Transient Power Supply Current Testing of Digital CMOS Circuits.
ITC 1995: 892-901 |
5 | EE | Shyang-Tai Su,
Rafic Z. Makki,
Troy Nagle:
Transient power supply current monitoring - A new test method for CMOS VLSI circuits.
J. Electronic Testing 6(1): 23-43 (1995) |
1992 |
4 | EE | Shyang-Tai Su,
Rafic Z. Makki:
Testing of static random access memories by monitoring dynamic power supply current.
J. Electronic Testing 3(3): 265-278 (1992) |
1991 |
3 | | Rafic Z. Makki,
Kasra Daneshvar,
Farid Tranjan,
Richard Greene:
On the Integration of Design and Manufacturing for Improved Testability.
ITC 1991: 248-255 |
2 | | Rafic Z. Makki,
Silvio Bou-Ghazale,
Chen Tianshang:
Automatic Test Pattern Generation with Branch Testing.
IEEE Trans. Computers 40(6): 785-791 (1991) |
1986 |
1 | | Rafic Z. Makki,
C. Tiansheng:
Designing Testable Control Paths with Multiple and Feedback Scan-Paths.
ITC 1986: 484-492 |