dblp.uni-trier.dewww.uni-trier.de

David C. Keezer

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo
Home Page

2008
30EEDavid C. Keezer, Dany Minier, Patrice Ducharme: Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications. DATE 2008: 1486-1491
2007
29EEDavid C. Keezer, Dany Minier, Patrice Ducharme: Method for reducing jitter in multi-gigahertz ATE. DATE 2007: 701-706
28EEDavid C. Keezer, C. Gray, A. M. Majid, N. Taher: Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL CoRR abs/0710.4761: (2007)
2006
27EEDavid C. Keezer, Dany Minier, Patrice Ducharme: Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses. IEEE Design & Test of Computers 23(1): 46-57 (2006)
2005
26EEA. M. Majid, David C. Keezer, J. V. Karia: A 5 Gbps Wafer-Level Tester. Asian Test Symposium 2005: 58-63
25EEDavid C. Keezer, C. Gray, A. M. Majid, N. Taher: Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL. DATE 2005: 152-157
2004
24EEDavid C. Keezer, Dany Minier, F. Binette: Modular Extension of ATE to 5 Gbps. ITC 2004: 748-757
23EEDavid C. Keezer, Dany Minier, Marie-Christine Caron: Multiplexing ATE Channels for Production Testing at 2.5 Gbps. IEEE Design & Test of Computers 21(4): 288-301 (2004)
2003
22EEJ. S. Davis, David C. Keezer, O. Liboiron-Ladouceur, K. Bergman: Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ITC 2003: 166-174
21EEDavid C. Keezer, Dany Minier, Marie-Christine Caron: A Production-Oriented Multiplexing System for Testing above 2.5 Gbps. ITC 2003: 191-200
2002
20EEDavid C. Keezer: GHz Testing and Its Fuzzy Targets. ITC 2002: 1230
19EEJ. S. Davis, David C. Keezer: Multi-Purpose Digital Test Core Utilizing Programmable Logic. ITC 2002: 438-445
18EEKarim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei: Multi-GigaHertz Testing Challenges and Solutions. VTS 2002: 265-268
2001
17 David C. Keezer, Q. Zhou, C. Bair, J. Kuan, B. Poole: Terabit-per-second automated digital testing. ITC 2001: 1143-1189
1999
16 David C. Keezer, Q. Zhou: Test support processors for enhanced testability of high performance circuits. ITC 1999: 801-809
1998
15EEDavid C. Keezer, K. E. Newman, J. S. Davis: Improved sensitivity for parallel test of substrate interconnections. ITC 1998: 228-233
14EEBruce C. Kim, David C. Keezer, Abhijit Chatterjee: A high throughput test methodology for MCM substrates. ITC 1998: 234-
13EEDavid C. Keezer, Q. Zhou: Alternative interface methods for testing high speed bidirectional signals. ITC 1998: 824-830
1997
12 K. E. Newman, David C. Keezer: A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. ITC 1997: 370-378
11 David C. Keezer, R. J. Wenzel: Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. ITC 1997: 94-100
1995
10 David C. Keezer: Electrical Troubleshooting, Diagnostics, and Repair of Multichip Modules. ITC 1995: 917
1993
9 N. Ranganathan, Raghu Sastry, R. Venkatesan, Joseph W. Yoder, David C. Keezer: SMAC: A Scene Matching Chip. ICCD 1993: 184-187
8 David C. Keezer: Known Godd Die for MCMs: Enabling Technologies. ITC 1993: 266
1992
7 David C. Keezer: MCM Test Using Available Technology. ITC 1992: 253
6 David C. Keezer, R. J. Wenzel: Calibration Techniques for a Gigahertz Test System. ITC 1992: 530-537
5 Vijay K. Jain, Hiroomi Hikawa, David C. Keezer: An Architecture for WSI Rapid Prototyping. IEEE Computer 25(4): 71-75 (1992)
1991
4 S. P. Athan, David C. Keezer, J. McKinley: High Frequency Wafer Probing and Power Supply Resonance Effects. ITC 1991: 1069-1078
3 David C. Keezer: Real-Time Data Comparison for GigaHertz Digital Test. ITC 1991: 790-797
2EEVijay K. Jain, David L. Landis, David C. Keezer, K. T. Wilson, D. Whittaker: Wafer Scale Integration: A university perspective. VLSI Signal Processing 2(4): 253-269 (1991)
1985
1 L. J. Falkenstrom, David C. Keezer, A. Patterson, Robert M. Rolfe, J. Wolcott: Tester Independent Support Software System (TISSS). ITC 1985: 685-691

Coauthor Index

1Karim Arabi [18]
2S. P. Athan [4]
3C. Bair [17]
4K. Bergman [22]
5F. Binette [24]
6Marie-Christine Caron [21] [23]
7Abhijit Chatterjee [14]
8J. S. Davis [15] [19] [22]
9Patrice Ducharme [27] [29] [30]
10L. J. Falkenstrom [1]
11C. Gray [25] [28]
12Hiroomi Hikawa [5]
13Klaus-Dieter Hilliges [18]
14Vijay K. Jain [2] [5]
15J. V. Karia [26]
16Bruce C. Kim [14]
17J. Kuan [17]
18David L. Landis [2]
19O. Liboiron-Ladouceur [22]
20A. M. Majid [25] [26] [28]
21J. McKinley [4]
22Dany Minier [21] [23] [24] [27] [29] [30]
23K. E. Newman [12] [15]
24A. Patterson [1]
25B. Poole [17]
26N. Ranganathan (Nagarajan Ranganathan) [9]
27Robert M. Rolfe [1]
28Raghu Sastry [9]
29Sassan Tabatabaei [18]
30N. Taher [25] [28]
31R. Venkatesan [9]
32R. J. Wenzel [6] [11]
33D. Whittaker [2]
34K. T. Wilson [2]
35J. Wolcott [1]
36Joseph W. Yoder [9]
37Q. Zhou [13] [16] [17]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)