David C. Keezer

2008
30	EE	David C. Keezer, Dany Minier, Patrice Ducharme: Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications. DATE 2008: 1486-1491
2007
29	EE	David C. Keezer, Dany Minier, Patrice Ducharme: Method for reducing jitter in multi-gigahertz ATE. DATE 2007: 701-706
28	EE	David C. Keezer, C. Gray, A. M. Majid, N. Taher: Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL CoRR abs/0710.4761: (2007)
2006
27	EE	David C. Keezer, Dany Minier, Patrice Ducharme: Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses. IEEE Design & Test of Computers 23(1): 46-57 (2006)
2005
26	EE	A. M. Majid, David C. Keezer, J. V. Karia: A 5 Gbps Wafer-Level Tester. Asian Test Symposium 2005: 58-63
25	EE	David C. Keezer, C. Gray, A. M. Majid, N. Taher: Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL. DATE 2005: 152-157
2004
24	EE	David C. Keezer, Dany Minier, F. Binette: Modular Extension of ATE to 5 Gbps. ITC 2004: 748-757
23	EE	David C. Keezer, Dany Minier, Marie-Christine Caron: Multiplexing ATE Channels for Production Testing at 2.5 Gbps. IEEE Design & Test of Computers 21(4): 288-301 (2004)
2003
22	EE	J. S. Davis, David C. Keezer, O. Liboiron-Ladouceur, K. Bergman: Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ITC 2003: 166-174
21	EE	David C. Keezer, Dany Minier, Marie-Christine Caron: A Production-Oriented Multiplexing System for Testing above 2.5 Gbps. ITC 2003: 191-200
2002
20	EE	David C. Keezer: GHz Testing and Its Fuzzy Targets. ITC 2002: 1230
19	EE	J. S. Davis, David C. Keezer: Multi-Purpose Digital Test Core Utilizing Programmable Logic. ITC 2002: 438-445
18	EE	Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei: Multi-GigaHertz Testing Challenges and Solutions. VTS 2002: 265-268
2001
17		David C. Keezer, Q. Zhou, C. Bair, J. Kuan, B. Poole: Terabit-per-second automated digital testing. ITC 2001: 1143-1189
1999
16		David C. Keezer, Q. Zhou: Test support processors for enhanced testability of high performance circuits. ITC 1999: 801-809
1998
15	EE	David C. Keezer, K. E. Newman, J. S. Davis: Improved sensitivity for parallel test of substrate interconnections. ITC 1998: 228-233
14	EE	Bruce C. Kim, David C. Keezer, Abhijit Chatterjee: A high throughput test methodology for MCM substrates. ITC 1998: 234-
13	EE	David C. Keezer, Q. Zhou: Alternative interface methods for testing high speed bidirectional signals. ITC 1998: 824-830
1997
12		K. E. Newman, David C. Keezer: A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. ITC 1997: 370-378
11		David C. Keezer, R. J. Wenzel: Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. ITC 1997: 94-100
1995
10		David C. Keezer: Electrical Troubleshooting, Diagnostics, and Repair of Multichip Modules. ITC 1995: 917
1993
9		N. Ranganathan, Raghu Sastry, R. Venkatesan, Joseph W. Yoder, David C. Keezer: SMAC: A Scene Matching Chip. ICCD 1993: 184-187
8		David C. Keezer: Known Godd Die for MCMs: Enabling Technologies. ITC 1993: 266
1992
7		David C. Keezer: MCM Test Using Available Technology. ITC 1992: 253
6		David C. Keezer, R. J. Wenzel: Calibration Techniques for a Gigahertz Test System. ITC 1992: 530-537
5		Vijay K. Jain, Hiroomi Hikawa, David C. Keezer: An Architecture for WSI Rapid Prototyping. IEEE Computer 25(4): 71-75 (1992)
1991
4		S. P. Athan, David C. Keezer, J. McKinley: High Frequency Wafer Probing and Power Supply Resonance Effects. ITC 1991: 1069-1078
3		David C. Keezer: Real-Time Data Comparison for GigaHertz Digital Test. ITC 1991: 790-797
2	EE	Vijay K. Jain, David L. Landis, David C. Keezer, K. T. Wilson, D. Whittaker: Wafer Scale Integration: A university perspective. VLSI Signal Processing 2(4): 253-269 (1991)
1985
1		L. J. Falkenstrom, David C. Keezer, A. Patterson, Robert M. Rolfe, J. Wolcott: Tester Independent Support Software System (TISSS). ITC 1985: 685-691

Coauthor Index

1	Karim Arabi	[18]
2	S. P. Athan	[4]
3	C. Bair	[17]
4	K. Bergman	[22]
5	F. Binette	[24]
6	Marie-Christine Caron	[21] [23]
7	Abhijit Chatterjee	[14]
8	J. S. Davis	[15] [19] [22]
9	Patrice Ducharme	[27] [29] [30]
10	L. J. Falkenstrom	[1]
11	C. Gray	[25] [28]
12	Hiroomi Hikawa	[5]
13	Klaus-Dieter Hilliges	[18]
14	Vijay K. Jain	[2] [5]
15	J. V. Karia	[26]
16	Bruce C. Kim	[14]
17	J. Kuan	[17]
18	David L. Landis	[2]
19	O. Liboiron-Ladouceur	[22]
20	A. M. Majid	[25] [26] [28]
21	J. McKinley	[4]
22	Dany Minier	[21] [23] [24] [27] [29] [30]
23	K. E. Newman	[12] [15]
24	A. Patterson	[1]
25	B. Poole	[17]
26	N. Ranganathan (Nagarajan Ranganathan)	[9]
27	Robert M. Rolfe	[1]
28	Raghu Sastry	[9]
29	Sassan Tabatabaei	[18]
30	N. Taher	[25] [28]
31	R. Venkatesan	[9]
32	R. J. Wenzel	[6] [11]
33	D. Whittaker	[2]
34	K. T. Wilson	[2]
35	J. Wolcott	[1]
36	Joseph W. Yoder	[9]
37	Q. Zhou	[13] [16] [17]

Colors in the list of coauthors