2008 |
30 | EE | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications.
DATE 2008: 1486-1491 |
2007 |
29 | EE | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Method for reducing jitter in multi-gigahertz ATE.
DATE 2007: 701-706 |
28 | EE | David C. Keezer,
C. Gray,
A. M. Majid,
N. Taher:
Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL
CoRR abs/0710.4761: (2007) |
2006 |
27 | EE | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses.
IEEE Design & Test of Computers 23(1): 46-57 (2006) |
2005 |
26 | EE | A. M. Majid,
David C. Keezer,
J. V. Karia:
A 5 Gbps Wafer-Level Tester.
Asian Test Symposium 2005: 58-63 |
25 | EE | David C. Keezer,
C. Gray,
A. M. Majid,
N. Taher:
Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL.
DATE 2005: 152-157 |
2004 |
24 | EE | David C. Keezer,
Dany Minier,
F. Binette:
Modular Extension of ATE to 5 Gbps.
ITC 2004: 748-757 |
23 | EE | David C. Keezer,
Dany Minier,
Marie-Christine Caron:
Multiplexing ATE Channels for Production Testing at 2.5 Gbps.
IEEE Design & Test of Computers 21(4): 288-301 (2004) |
2003 |
22 | EE | J. S. Davis,
David C. Keezer,
O. Liboiron-Ladouceur,
K. Bergman:
Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober.
ITC 2003: 166-174 |
21 | EE | David C. Keezer,
Dany Minier,
Marie-Christine Caron:
A Production-Oriented Multiplexing System for Testing above 2.5 Gbps.
ITC 2003: 191-200 |
2002 |
20 | EE | David C. Keezer:
GHz Testing and Its Fuzzy Targets.
ITC 2002: 1230 |
19 | EE | J. S. Davis,
David C. Keezer:
Multi-Purpose Digital Test Core Utilizing Programmable Logic.
ITC 2002: 438-445 |
18 | EE | Karim Arabi,
Klaus-Dieter Hilliges,
David C. Keezer,
Sassan Tabatabaei:
Multi-GigaHertz Testing Challenges and Solutions.
VTS 2002: 265-268 |
2001 |
17 | | David C. Keezer,
Q. Zhou,
C. Bair,
J. Kuan,
B. Poole:
Terabit-per-second automated digital testing.
ITC 2001: 1143-1189 |
1999 |
16 | | David C. Keezer,
Q. Zhou:
Test support processors for enhanced testability of high performance circuits.
ITC 1999: 801-809 |
1998 |
15 | EE | David C. Keezer,
K. E. Newman,
J. S. Davis:
Improved sensitivity for parallel test of substrate interconnections.
ITC 1998: 228-233 |
14 | EE | Bruce C. Kim,
David C. Keezer,
Abhijit Chatterjee:
A high throughput test methodology for MCM substrates.
ITC 1998: 234- |
13 | EE | David C. Keezer,
Q. Zhou:
Alternative interface methods for testing high speed bidirectional signals.
ITC 1998: 824-830 |
1997 |
12 | | K. E. Newman,
David C. Keezer:
A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates.
ITC 1997: 370-378 |
11 | | David C. Keezer,
R. J. Wenzel:
Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test.
ITC 1997: 94-100 |
1995 |
10 | | David C. Keezer:
Electrical Troubleshooting, Diagnostics, and Repair of Multichip Modules.
ITC 1995: 917 |
1993 |
9 | | N. Ranganathan,
Raghu Sastry,
R. Venkatesan,
Joseph W. Yoder,
David C. Keezer:
SMAC: A Scene Matching Chip.
ICCD 1993: 184-187 |
8 | | David C. Keezer:
Known Godd Die for MCMs: Enabling Technologies.
ITC 1993: 266 |
1992 |
7 | | David C. Keezer:
MCM Test Using Available Technology.
ITC 1992: 253 |
6 | | David C. Keezer,
R. J. Wenzel:
Calibration Techniques for a Gigahertz Test System.
ITC 1992: 530-537 |
5 | | Vijay K. Jain,
Hiroomi Hikawa,
David C. Keezer:
An Architecture for WSI Rapid Prototyping.
IEEE Computer 25(4): 71-75 (1992) |
1991 |
4 | | S. P. Athan,
David C. Keezer,
J. McKinley:
High Frequency Wafer Probing and Power Supply Resonance Effects.
ITC 1991: 1069-1078 |
3 | | David C. Keezer:
Real-Time Data Comparison for GigaHertz Digital Test.
ITC 1991: 790-797 |
2 | EE | Vijay K. Jain,
David L. Landis,
David C. Keezer,
K. T. Wilson,
D. Whittaker:
Wafer Scale Integration: A university perspective.
VLSI Signal Processing 2(4): 253-269 (1991) |
1985 |
1 | | L. J. Falkenstrom,
David C. Keezer,
A. Patterson,
Robert M. Rolfe,
J. Wolcott:
Tester Independent Support Software System (TISSS).
ITC 1985: 685-691 |