Ralph Marlett

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1991

2 Sean P. Morley, Ralph Marlett: Selectable Length Partial Scan: A Method to Reduce Vector Length. ITC 1991: 385-392

1986

1 EE Ralph Marlett: An effective test generation system for sequential circuits. DAC 1986: 250-256

1991
2		Sean P. Morley, Ralph Marlett: Selectable Length Partial Scan: A Method to Reduce Vector Length. ITC 1991: 385-392
1986
1	EE	Ralph Marlett: An effective test generation system for sequential circuits. DAC 1986: 250-256

Coauthor Index

1 Sean P. Morley [2]