2000 |
13 | EE | Jaehong Park,
Carl Pixley,
Michael Burns,
Hyunwoo Cho:
An Efficient Logic Equivalence Checker for Industrial Circuits.
J. Electronic Testing 16(1-2): 91-106 (2000) |
1997 |
12 | EE | R. Iris Bahar,
Hyunwoo Cho,
Gary D. Hachtel,
Enrico Macii,
Fabio Somenzi:
Symbolic timing analysis and resynthesis for low power of combinational circuits containing false paths.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(10): 1101-1115 (1997) |
1996 |
11 | EE | Hyunwoo Cho,
Gary D. Hachtel,
Enrico Macii,
Massimo Poncino,
Fabio Somenzi:
Automatic state space decomposition for approximate FSM traversal based on circuit analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(12): 1451-1464 (1996) |
10 | EE | Hyunwoo Cho,
Gary D. Hachtel,
Enrico Macii,
Bernard Plessier,
Fabio Somenzi:
Algorithms for approximate FSM traversal based on state space decomposition.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(12): 1465-1478 (1996) |
1994 |
9 | | Hyunwoo Cho,
Gary D. Hachtel,
Enrico Macii,
Massimo Poncino,
Fabio Somenzi:
A State Space Decomposition Algorithm for Approximate FSM Traversal.
EDAC-ETC-EUROASIC 1994: 137-141 |
8 | | R. Iris Bahar,
Hyunwoo Cho,
Gary D. Hachtel,
Enrico Macii,
Fabio Somenzi:
Timing Analysis of Combinational Circuits using ADD's.
EDAC-ETC-EUROASIC 1994: 625-629 |
7 | | Hyunwoo Cho,
Gary D. Hachtel,
Enrico Macii,
Massimo Poncino,
Fabio Somenzi:
A Structural Approach to State Space Decomposition for Approximate Reachability Analysis.
ICCD 1994: 236-239 |
1993 |
6 | EE | Hyunwoo Cho,
Gary D. Hachtel,
Enrico Macii,
Bernard Plessier,
Fabio Somenzi:
Algorithms for Approximate FSM Traversal.
DAC 1993: 25-30 |
5 | EE | Hyunwoo Cho,
Gary D. Hachtel,
Fabio Somenzi:
Redundancy identification/removal and test generation for sequential circuits using implicit state enumeration.
IEEE Trans. on CAD of Integrated Circuits and Systems 12(7): 935-945 (1993) |
4 | EE | Hyunwoo Cho,
Seh-Woong Jeong,
Fabio Somenzi,
Carl Pixley:
Synchronizing sequences and symbolic traversal techniques in test generation.
J. Electronic Testing 4(1): 19-31 (1993) |
1991 |
3 | | Hyunwoo Cho,
Gary D. Hachtel,
Fabio Somenzi:
Redundancy Identification and Removal Based on Implicit State Enumeration.
ICCD 1991: 77-80 |
2 | | Hyunwoo Cho,
Gary D. Hachtel,
Fabio Somenzi:
Fast Sequential ATPG Based on Implicit State Enumeration.
ITC 1991: 67-74 |
1990 |
1 | | Hyunwoo Cho,
Gary D. Hachtel,
Seh-Woong Jeong,
Bernard Plessier,
Eric M. Schwarz,
Fabio Somenzi:
ATPG Aspects of FSM Verification.
ICCAD 1990: 134-137 |