H.-D. Oberle

1991
3		H.-D. Oberle, Peter Muhmenthaler: Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM. ITC 1991: 548-555
2	EE	G. Antonin, H.-D. Oberle, Jochen Kolzer: Electrical Characterization of Megabit DRAMs, Part 1: External Testing. IEEE Design & Test of Computers 8(3): 36-43 (1991)
1989
1		W. Malzfeldt, W. Mohr, H.-D. Oberle, K. Kodalle: Fast Automatic Failbit Analysis for DRAMs. ITC 1989: 431-438

Coauthor Index

1	G. Antonin	[2]
2	K. Kodalle	[1]
3	Jochen Kolzer	[2]
4	W. Malzfeldt	[1]
5	W. Mohr	[1]
6	Peter Muhmenthaler	[3]

Colors in the list of coauthors