| 2004 |
|---|
| 10 | EE | Ankan K. Pramanick,
Ramachandran Krishnaswamy,
Mark Elston,
Toshiaki Adachi,
Harsanjeet Singh,
Bruce R. Parnas:
Test Programming Environment in a Modular, Open Architecture Test System.
ITC 2004: 413-422 |
| 1997 |
|---|
| 9 | EE | Ankan K. Pramanick,
Sudhakar M. Reddy:
On the fault coverage of gate delay fault detecting tests.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(1): 78-94 (1997) |
| 1995 |
|---|
| 8 | | Ira Pramanick,
Ankan K. Pramanick:
Parallel Delay Fault Coverage and Test Quality Evaluation.
ITC 1995: 113-122 |
| 7 | EE | Ankan K. Pramanick,
Sudhakar M. Reddy:
Efficient multiple path propagating tests for delay faults.
J. Electronic Testing 7(3): 157-172 (1995) |
| 1994 |
|---|
| 6 | | Ira Pramanick,
Ankan K. Pramanick:
Distributed Solutions to the Delay Fault Test Quality Evaluation Problem.
HPDC 1994: 177-185 |
| 1993 |
|---|
| 5 | | Ankan K. Pramanick,
Sandip Kundu:
Design of Scan-Based Path-Delay-Testable Sequential Circuits.
ITC 1993: 962-971 |
| 4 | | Ankan K. Pramanick,
Sudhakar M. Reddy:
On Unified Delay Fault Testing.
VLSI Design 1993: 265-268 |
| 1991 |
|---|
| 3 | | Ankan K. Pramanick,
Sudhakar M. Reddy:
On Multiple Path Propagating Tests for Path Delay Faults.
ITC 1991: 393-402 |
| 1990 |
|---|
| 2 | EE | Ankan K. Pramanick,
Sudhakar M. Reddy:
On the fault coverage of delay fault detecting tests.
EURO-DAC 1990: 334-338 |
| 1988 |
|---|
| 1 | | Ankan K. Pramanick,
Sudhakar M. Reddy:
On the Detection of Delay Faults.
ITC 1988: 845-856 |
