Jerry M. Soden

2002
22	EE	Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins: Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC 2002: 90-99
21	EE	B. Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura: Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC 2002: 947-953
2001
20	EE	Ivan de Paúl, M. Rosales, B. Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden: Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS 2001: 286-291
1999
19		Charles F. Hawkins, Jerry M. Soden: Deep Submicron CMOS Current IC Testing: Is There a Future? IEEE Design & Test of Computers 16(4): 14-15 (1999)
18	EE	Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin: Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Design & Test of Computers 16(4): 66-73 (1999)
1998
17	EE	Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell: CMOS IC reliability indicators and burn-in economics. ITC 1998: 194-203
1997
16		Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins: Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31
15		Christopher L. Henderson, Jerry M. Soden: Signature Analysis for IC Diagnosis and Failure Analysis. ITC 1997: 310-318
14		Jerry M. Soden, Christopher L. Henderson: IC Diagnosis: Industry Issues. ITC 1997: 435
13		Jerry M. Soden, Christopher L. Henderson: Still in the Stone Age? IEEE Design & Test of Computers 14(3): 128- (1997)
12	EE	Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson: IC Failure Analysis: Magic, Mystery, and Science. IEEE Design & Test of Computers 14(3): 59-69 (1997)
1996
11		Alan W. Righter, Jerry M. Soden, Richard W. Beegle: High Resolution IDDQ Characterization and Testing - Practical Issues. ITC 1996: 259-268
10		Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson: IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. ITC 1996: 935
9	EE	Jerry M. Soden, Charles F. Hawkins: IDDQ Testing: Issues Present and Future. IEEE Design & Test of Computers 13(4): 61-65 (1996)
1995
8		Charles F. Hawkins, Jerry M. Soden: IDDQ Design and Test Advantages Propel Industry. IEEE Design & Test of Computers 12(2): 40-41 (1995)
1994
7		Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson: Defect Classes - An Overdue Paradigm for CMOS IC. ITC 1994: 413-425
1993
6		Jerry M. Soden, Charles F. Hawkins: Quality Testing Requires Quality Thinking. ITC 1993: 596
1992
5	EE	Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao: IDDQ testing: A review. J. Electronic Testing 3(4): 291-303 (1992)
1991
4		Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins: The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. ITC 1991: 302-310
1989
3		Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins: CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC 1989: 423-430
1986
2		Jerry M. Soden, Charles F. Hawkins: Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. ITC 1986: 443-451
1985
1		Jerry M. Soden, Charles F. Hawkins: Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC 1985: 544-557

Coauthor Index

1	B. Alorda	[20] [21]
2	Richard E. Anderson	[10] [12]
3	Daniel L. Barton	[16]
4	Richard W. Beegle	[11] [16]
5	Patrick L. Candelaria	[16]
6	Edward I. Cole Jr.	[16]
7	Ted Dellin	[18]
8	F. Joel Ferguson	[7]
9	Ravi K. Gulati	[5]
10	Charles F. Hawkins	[1] [2] [3] [4] [5] [6] [7] [8] [9] [16] [17] [18] [19] [20] [21] [22]
11	Christopher L. Henderson	[4] [10] [12] [13] [14] [15] [16]
12	Ali Keshavarzi	[22]
13	Weiwei Mao	[5]
14	Peter C. Maxwell	[17]
15	Ivan de Paúl	[20]
16	Alan W. Righter	[7] [11] [17]
17	M. Rosales	[20] [21]
18	Jaume Segura	[18] [20] [21] [22]
19	Paiboon Tangyunyong	[16]
20	Michael R. Taylor	[3]
21	R. Keith Treece	[3]