| 2007 |
|---|
| 13 | EE | Jaehoon Song,
Hyunbean Yi,
Juhee Han,
Sungju Park:
An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips.
Asia-Pacific Computer Systems Architecture Conference 2007: 139-150 |
| 12 | EE | Jaehoon Song,
Piljae Min,
Hyunbean Yi,
Sungju Park:
Design of Test Access Mechanism for AMBA-Based System-on-a-Chip.
VTS 2007: 375-380 |
| 2004 |
|---|
| 11 | EE | Sungju Park,
Sangwook Cho,
Seiyang Yang,
Maciej J. Ciesielski:
A new state assignment technique for testing and low power.
DAC 2004: 510-513 |
| 2002 |
|---|
| 10 | EE | Jaehoon Song,
Sungju Park:
A Simple Wrapped Core Linking Module for SoC Test Access.
Asian Test Symposium 2002: 344-349 |
| 9 | EE | NamRye Son,
YoJin Yang,
Gueesang Lee,
Sungju Park:
A New Boundary Matching Algorithm Based on Edge Detection.
EurAsia-ICT 2002: 84-92 |
| 2001 |
|---|
| 8 | EE | Dongkyu Youn,
Taehyung Kim,
Sungju Park:
A Microcode-Based Memory BIST Implementing Modified March Algorithm.
Asian Test Symposium 2001: 391-395 |
| 7 | EE | Migyoung Jung,
Gueesang Lee,
Sungju Park,
Rolf Drechsler:
Minimization of OPKFDDs Using Genetic Algorithms.
DSD 2001: 72-78 |
| 6 | EE | Sungju Park,
Dongman Lee,
Mingyu Lim,
Chansu Yu:
Scalable data management using user-based caching and prefetching in distributed virtual environments.
VRST 2001: 121-126 |
| 2000 |
|---|
| 5 | EE | Sungju Park,
Taehyung Kim:
A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects.
DATE 2000: 458- |
| 1996 |
|---|
| 4 | EE | Sungju Park:
A New Complete Diagnosis Patterns for Wiring Interconnects.
DAC 1996: 203-208 |
| 1992 |
|---|
| 3 | | Sungju Park,
Sheldon B. Akers:
A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination.
ITC 1992: 303-311 |
| 2 | EE | Sungju Park,
Sheldon B. Akers:
Parity bit calculation and test signal compaction for BIST applications.
J. Electronic Testing 3(1): 45-52 (1992) |
| 1991 |
|---|
| 1 | | Sungju Park,
Sheldon B. Akers:
Parity Bit Calculation and Test Signal Compaction for BIST Applications.
ITC 1991: 1016-1023 |
