| 2006 |
|---|
| 8 | EE | Peter Muhmenthaler:
New on-Chip DFT and ATE Features for Efficient Embedded Memory Test.
MTDT 2006 |
| 7 | EE | Ajay Khoche,
Peter Muhmenthaler:
Session Abstract.
VTS 2006: 288-289 |
| 2004 |
|---|
| 6 | EE | Andreas Leininger,
Michael Gössel,
Peter Muhmenthaler:
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code.
DATE 2004: 1302-1309 |
| 2003 |
|---|
| 5 | EE | Frank Poehl,
Matthias Beck,
Ralf Arnold,
Peter Muhmenthaler,
Nagesh Tamarapalli,
Mark Kassab,
Nilanjan Mukherjee,
Janusz Rajski:
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions.
ITC 2003: 1211-1220 |
| 2002 |
|---|
| 4 | EE | Peter Muhmenthaler:
Outsourcing Test without Standards?.
ITC 2002: 1217-1218 |
| 2001 |
|---|
| 3 | EE | Yervant Zorian,
Paolo Prinetto,
João Paulo Teixeira,
Isabel C. Teixeira,
Carlos Eduardo Pereira,
Octávio Páscoa Dias,
Jorge Semião,
Peter Muhmenthaler,
W. Radermacher:
Embedded tutorial: TRP: integrating embedded test and ATE.
DATE 2001: 34-37 |
| 2000 |
|---|
| 2 | EE | Yervant Zorian,
Michael Nicolaidis,
Peter Muhmenthaler,
David Y. Lepejian,
Chris W. H. Strolenberg,
Kees Veelenturf:
Tutorial Statement.
DATE 2000: 66 |
| 1991 |
|---|
| 1 | | H.-D. Oberle,
Peter Muhmenthaler:
Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM.
ITC 1991: 548-555 |
