N. Croitoru

2001
2	EE	G. Golan, E. Rabinovich, A. Inberg, A. Axelevitch, G. Lubarsky, P. G. Rancoita, M. Demarchi, A. Seidman, N. Croitoru: Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. Microelectronics Reliability 41(1): 67-72 (2001)
1991
1		E. Weis, E. Kinsbron, M. Snyder, B. Vogel, N. Croitoru: Electromigration Effects in VLSI Due to Various Current Types. ITC 1991: 354-357

Coauthor Index

1	A. Axelevitch	[2]
2	M. Demarchi	[2]
3	G. Golan	[2]
4	A. Inberg	[2]
5	E. Kinsbron	[1]
6	G. Lubarsky	[2]
7	E. Rabinovich	[2]
8	P. G. Rancoita	[2]
9	A. Seidman	[2]
10	M. Snyder	[1]
11	B. Vogel	[1]
12	E. Weis	[1]

Colors in the list of coauthors