| |
| 1991 | ||
|---|---|---|
| 2 | Tsu-Wei Ku, Wei-Kong Chia: A Sequential Test Generator with Explicit Elimination of Easy-to-Test Faults. ITC 1991: 83-87 | |
| 1990 | ||
| 1 | Tsu-Wei Ku, Wei-Kong Chia: Test Vector Minimization During Logic Synthesis. ICCAD 1990: 318-321 | |
| 1 | Tsu-Wei Ku | [1] [2] |