E. Kinsbron
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1991
1
E. Weis
, E. Kinsbron,
M. Snyder
,
B. Vogel
,
N. Croitoru
: Electromigration Effects in VLSI Due to Various Current Types.
ITC 1991
: 354-357
Coauthor
Index
1
N. Croitoru
[
1
]
2
M. Snyder
[
1
]
3
B. Vogel
[
1
]
4
E. Weis
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
