| 2005 |
| 14 | EE | Kristina Forsberg,
Simin Nadjm-Tehrani,
Jan Torin:
Fault Analysis of a Distributed Flight Control System.
HICSS 2005 |
| 2004 |
| 13 | | Per Johannessen,
Fredrik Törner,
Jan Torin:
Experiences from Model Based Development of Drive-By-Wire Control Systems.
DIPES 2004: 103-112 |
| 12 | | Håkan Sivencrona,
Mattias Persson,
Jan Torin:
A Membership Agreement Algorithm Detecting and Tolerating Asymmetric Timing Faults.
DIPES 2004: 63-72 |
| 11 | EE | Håkan Sivencrona,
Torbjörn Olsson,
Roger Johansson,
Jan Torin:
RedCAN: Simulations of Two Fault Recovery Algorithms for CAN.
PRDC 2004: 302-311 |
| 10 | EE | Per Johannessen,
Fredrik Törner,
Jan Torin:
Actuator Based Hazard Analysis for Safety Critical Systems.
SAFECOMP 2004: 130-141 |
| 2003 |
| 9 | EE | Astrit Ademaj,
Håkan Sivencrona,
Günther Bauer,
Jan Torin:
Evaluation of Fault Handling of the Time-Triggered Architecture with Bus and Star Topology.
DSN 2003: 123- |
| 8 | EE | Håkan Sivencrona,
Per Johannessen,
Mattias Persson,
Jan Torin:
Heavy-Ion Fault Injections in the Time-Triggered Communication Protocol.
LADC 2003: 69-80 |
| 2001 |
| 7 | EE | Per Johannessen,
Christian Grante,
Anders Alminger,
Ulrik Eklund,
Jan Torin:
Hazard Analysis in Object Oriented Design of Dependable Systems.
DSN 2001: 507-512 |
| 6 | EE | Kristina Ahlström,
Jan Torin,
Per Johannessen:
Design Method for Conceptual Design of By-Wire Control: Two Case Studies.
ICECCS 2001: 133-143 |
| 1994 |
| 5 | | Marcus Rimén,
Joakim Ohlsson,
Jan Torin:
On Microprocessor Error Behaviour Modeling.
FTCS 1994: 76-85 |
| 1992 |
| 4 | | Ghassem Miremadi,
Johan Karlsson,
Ulf Gunneflo,
Jan Torin:
Two Software Techniques for On-line Error Detection.
FTCS 1992: 328-335 |
| 3 | | Peter Lidén,
Peter Dahlgren,
Jan Torin:
Transistor Fault Coverage for Self-Testing CMOS Checkers.
ITC 1992: 476-485 |
| 1991 |
| 2 | | Johan Karlsson,
Ulf Gunneflo,
Peter Lidén,
Jan Torin:
Two Fault Injection Techniques for Test of Fault Handling Mechanisms.
ITC 1991: 140-149 |
| 1989 |
| 1 | | Johan Karlsson,
Ulf Gunneflo,
Jan Torin:
The Effects of Heavy-Ion Induced Single Event Upsets in the MC6809E Microprocessor.
Fehlertolerierende Rechensysteme 1989: 296-307 |