Eric Bruls

E. M. J. G. Bruls

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8EER. de Vries, Taco Zwemstra, E. M. J. G. Bruls, Paul P. L. Regtien: Built-in self-test methodology for A/D converters. ED&TC 1997: 353-358
7 Marly Roncken, Eric Bruls: Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. ITC 1996: 205-214
6EERosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras: Bridging defects resistance in the metal layer of a CMOS process. J. Electronic Testing 8(1): 35-46 (1996)
5 Eric Bruls: Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits. ITC 1994: 562-571
4 R. J. A. Harvey, Andrew M. D. Richardson, Eric Bruls, Keith Baker: Analogue Fault Simulation Based on Layout-Dependent Fault Models. ITC 1994: 641-649
3 M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess: Parameter Monitoring: Advantages and Pitfalls. ITC 1993: 115-124
2 Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls: Bridging Defects Resistance Measurements in a CMOS Process. ITC 1992: 892-899
1 Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess: A Generic Method to Develop a Defect Monitoring System for IC Processes. ITC 1991: 218-227

Coauthor Index

1Keith Baker [3] [4]
2F. Camerik [1]
3Joan Figueras [2] [6]
4R. J. A. Harvey [4]
5Jochen A. G. Jess [1] [3]
6H. J. Kretschman [1]
7Paul P. L. Regtien [8]
8Andrew M. D. Richardson [4]
9Rosa Rodríguez-Montañés [2] [6]
10Marly Roncken [7]
11M. M. A. van Rosmalen [3]
12R. de Vries [8]
13Taco Zwemstra [8]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)