E. M. J. G. Bruls
List of publications from the
| 1997 |
|---|
| 8 | EE | R. de Vries,
Taco Zwemstra,
E. M. J. G. Bruls,
Paul P. L. Regtien:
Built-in self-test methodology for A/D converters.
ED&TC 1997: 353-358 |
| 1996 |
|---|
| 7 | | Marly Roncken,
Eric Bruls:
Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation.
ITC 1996: 205-214 |
| 6 | EE | Rosa Rodríguez-Montañés,
E. M. J. G. Bruls,
Joan Figueras:
Bridging defects resistance in the metal layer of a CMOS process.
J. Electronic Testing 8(1): 35-46 (1996) |
| 1994 |
|---|
| 5 | | Eric Bruls:
Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits.
ITC 1994: 562-571 |
| 4 | | R. J. A. Harvey,
Andrew M. D. Richardson,
Eric Bruls,
Keith Baker:
Analogue Fault Simulation Based on Layout-Dependent Fault Models.
ITC 1994: 641-649 |
| 1993 |
|---|
| 3 | | M. M. A. van Rosmalen,
Keith Baker,
Eric Bruls,
Jochen A. G. Jess:
Parameter Monitoring: Advantages and Pitfalls.
ITC 1993: 115-124 |
| 1992 |
|---|
| 2 | | Rosa Rodríguez-Montañés,
Joan Figueras,
Eric Bruls:
Bridging Defects Resistance Measurements in a CMOS Process.
ITC 1992: 892-899 |
| 1991 |
|---|
| 1 | | Eric Bruls,
F. Camerik,
H. J. Kretschman,
Jochen A. G. Jess:
A Generic Method to Develop a Defect Monitoring System for IC Processes.
ITC 1991: 218-227 |
