Bernard Courtois

2009
54	EE	Bernard Courtois, Kholdoun Torki, S. Dumont, S. Eyraud, J.-F. Paillotin, G. di Pendina: Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. VLSI Design 2009: 561-566
2007
53	EE	P. Szabo, B. Nemeth, Márta Rencz, Bernard Courtois: Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology CoRR abs/0711.3301: (2007)
2006
52	EE	Bernard Courtois: Session Abstract. VTS 2006: 150-151
2005
51	EE	Bernard Courtois: Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. Microelectronics Journal 36(7): 613 (2005)
2004
50	EE	Bernard Courtois: Infrastructures for Education, Research and Industry in Microelectronics - A review. DELTA 2004: 149-156
49	EE	Salvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463-
2003
48	EE	Bernard Courtois: Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. it - Information Technology 45(6): (2003)
2001
47	EE	Kholdoun Torki, Bernard Courtois: CMP: The Access to Advanced Low Costy Manufacturing. MSE 2001: 6-
46	EE	Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217
45	EE	Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electronic Testing 17(6): 459-470 (2001)
2000
44	EE	Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
43	EE	Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)
42	EE	Salvador Mir, Benoît Charlot, Bernard Courtois: Extending Fault-Based Testing to Microelectromechanical Systems. J. Electronic Testing 16(3): 279-288 (2000)
41	EE	Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000)
1999
40		Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
39	EE	Kholdoun Torki, Bernard Courtois: Advanced Low Cost Manufacturing From CMP Service. MSE 1999: 4-5
38		Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
37		Bernard Courtois, R. D. (Shawn) Blanton: Guest Editors' Introduction. IEEE Design & Test of Computers 16(4): 16-17 (1999)
1998
36	EE	Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-
35	EE	S. J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois: 3D CMOS SOL for high performance computing. ISLPED 1998: 54-58
34	EE	A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550
33	EE	Vladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998)
32		Marcelo Lubaszewski, Bernard Courtois: A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998)
31	EE	Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998)
1997
30	EE	Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679
29	EE	Klaus Hofmann, Manfred Glesner, Nicu Sebe, A. Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois: Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC 1997: 108-112
28	EE	Vladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445
27	EE	Jean-Michel Karam, Bernard Courtois, Hicham Boutamine: CAD Tools for Bridging Microsystems and Foundries. IEEE Design & Test of Computers 14(2): 34-39 (1997)
1996
26	EE	Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288
25		Bozena Kaminska, Bernard Courtois: Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Design & Test of Computers 13(2): 8-9 (1996)
24		Bernard Courtois: Second Therminic Workshop. IEEE Design & Test of Computers 13(4): 5- (1996)
23	EE	Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Unified built-in self-test for fully differential analog circuits. J. Electronic Testing 9(1-2): 135-151 (1996)
22	EE	Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing 9(1-2): 43-57 (1996)
21	EE	Bozena Kaminska, Bernard Courtois: Guest editorial. J. Electronic Testing 9(1-2): 7-8 (1996)
1995
20	EE	Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189-
19	EE	Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59
18		Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois: Conference Reports. IEEE Design & Test of Computers 12(4): 95-97 (1995)
17		Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995)
16	EE	Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)
1994
15	EE	Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490
1993
14		F. L. Vargas, Michael Nicolaidis, Bernard Courtois: Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD 1993: 596-600
1992
13		Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski: Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129
12		Marcelo Lubaszewski, Bernard Courtois: On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381
1991
11		Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois: Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251
10		M. Marzouki, J. Laurent, Bernard Courtois: Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. ITC 1991: 238-247
1990
9	EE	P. Bondono, Ahmed Amine Jerraya, A. Hornik, Bernard Courtois, D. Bonifas: NAUTILE: a safe environment for silicon compilation. EURO-DAC 1990: 605-609
1989
8		René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)
1988
7		Jean Paul Caisso, Bernard Courtois: Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC 1988: 94-101
6		Ingrid Jansch, Bernard Courtois: Definition and Design of Strongly Language Disjoint Checkers. IEEE Trans. Computers 37(6): 745-748 (1988)
5		Michael Nicolaidis, Bernard Courtois: Strongly Code Disjoint Checkers. IEEE Trans. Computers 37(6): 751-756 (1988)
1986
4	EE	Ahmed Amine Jerraya, P. Varinot, R. Jamier, Bernard Courtois: Principles of the SYCO compiler. DAC 1986: 715-721
3		J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin: Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC 1986: 465-473
1984
2		H. Sahami, Bernard Courtois: Functional testing vs. structural testing of RAMs. Fehlertolerierende Rechensysteme 1984: 391-403
1981
1		Bernard Courtois: Analytical Testing of Data Processing Sections of Integrated CPUs. ITC 1981: 21-30

Coauthor Index

1	S. J. Abou-Samra	[35]
2	Vishwani D. Agrawal	[20]
3	P. A. Aisa	[35]
4	Vladimir Castro Alves	[11]
5	L. Bergher	[3]
6	R. D. (Shawn) Blanton (Ronald D. Blanton)	[37]
7	P. Bondono	[9]
8	D. Bonifas	[9]
9	Hicham Boutamine	[27] [30]
10	Jean Paul Caisso	[7]
11	A. Castillejo	[34]
12	Sreejit Chakravarty	[18]
13	Benoît Charlot	[40] [42] [44] [45] [46]
14	P. Pal Chaudhuri	[20]
15	Jacques P. Collin	[3]
16	Philippe Coste	[44]
17	Érika F. Cota	[36] [40]
18	René David	[8]
19	P. Drake	[30]
20	S. Dumont	[54]
21	S. Eyraud	[54]
22	Antoine Fuentes	[8]
23	Manfred Glesner	[29] [30] [38]
24	Alain Guyot	[35]
25	Sybille Hellebrand	[13] [17]
26	Fumiyasu Hirose	[20]
27	Klaus Hofmann	[29] [30] [38]
28	A. Hornik	[9]
29	R. Jamier	[4]
30	Ingrid Jansch	[6]
31	Ahmed Amine Jerraya	[4] [9] [44]
32	Bozena Kaminska	[18] [19] [21] [25]
33	Jean-Michel Karam	[26] [27] [29] [30] [31] [34] [38]
34	Vladimir Kolarik	[15] [16] [43]
35	Sandip Kundu	[20]
36	J. Laurent	[3] [10]
37	Chung-Len Lee	[20]
38	P. Lestrat	[11]
39	Marcelo Lubaszewski	[12] [15] [16] [19] [22] [23] [26] [31] [32] [36] [38] [40] [43]
40	A. Manolescu	[29]
41	Santiago Marco	[29]
42	M. Marzouki	[10]
43	Yinghua Min	[20]
44	Salvador Mir	[15] [16] [22] [23] [34] [38] [40] [42] [43] [44] [45] [46] [49]
45	B. Nemeth	[53]
46	Michael Nicolaidis	[5] [11] [14]
47	Gabriela Nicolescu	[44]
48	C. Nielsen	[15] [43]
49	J.-F. Paillotin	[54]
50	Fabien Parrain	[44] [45] [46]
51	G. di Pendina	[54]
52	Gil Philips	[18]
53	András Poppe	[30]
54	Janusz Rajski	[13] [17]
55	Márta Rencz	[26] [28] [30] [31] [33] [38] [41] [44] [53]
56	Libor Rufer	[49]
57	Khaled Saab	[19]
58	H. Sahami	[2]
59	Josep Samitier	[29]
60	Nicu Sebe	[29]
61	Ramalingam Sridhar	[18]
62	P. Szabo	[53]
63	Vladimir Székely	[26] [28] [30] [31] [33] [38] [41]
64	Steffen Tarnick	[13] [17]
65	Kholdoun Torki	[39] [41] [47] [54]
66	S. Török	[41]
67	Shambhu J. Upadhyaya	[18]
68	F. L. Vargas	[14]
69	P. Varinot	[4]
70	Srikanth Venkataraman	[17]
71	D. Veychard	[34]
72	Nacer-Eddine Zergainoh	[44]
73	Yervant Zorian	[18]

Colors in the list of coauthors