1991 | ||
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3 | EE | E. Vandris, Gerald E. Sobelman: Algorithms for Fast, Memory Efficient Switch-Level Fault Simulation. DAC 1991: 138-143 |
2 | E. Vandris, Gerald E. Sobelman: A Mixed Functional/IDDQ Testing Methodology for CMOS Transistor Faults. ITC 1991: 608-614 | |
1990 | ||
1 | E. Vandris, Gerald E. Sobelman: Fast Switch-Level Fault Simulation Using Functional Fault Modeling. ICCAD 1990: 74-77 |
1 | Gerald E. Sobelman | [1] [2] [3] |