| 2004 |
|---|
| 7 | EE | Thomas M. Storey:
Testing in a high volume DSM Environment.
ITC 2004: 1422 |
| 2003 |
|---|
| 6 | EE | Wojciech Maly,
Anne E. Gattiker,
Thomas Zanon,
Thomas J. Vogels,
R. D. (Shawn) Blanton,
Thomas M. Storey:
Deformations of IC Structure in Test and Yield Learning.
ITC 2003: 856-865 |
| 1997 |
|---|
| 5 | EE | Thomas M. Storey,
Bruce McWilliam:
A Test Methodology for High Performance MCMs.
J. Electronic Testing 10(1-2): 109-118 (1997) |
| 1994 |
|---|
| 4 | | Thomas M. Storey,
C. Lapihuska,
E. Atwood,
L. Su:
A Test Methodology to Support an ASEM MCM Foundry.
ITC 1994: 426-435 |
| 1993 |
|---|
| 3 | | Thomas M. Storey:
A Test Methodology for VLSI Chips on Silicon.
ITC 1993: 359-368 |
| 1991 |
|---|
| 2 | | Thomas M. Storey,
Wojciech Maly,
John Andrews,
Myron Miske:
Stuck Fault and Current Testing Comparison Using CMOS Chip Test.
ITC 1991: 311-318 |
| 1990 |
|---|
| 1 | | Thomas M. Storey,
Wojciech Maly:
CMOS Bridging Fault Detection.
ITC 1990: 1123-1132 |
