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Richard H. Williams

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1993
4 Richard H. Williams, Charles F. Hawkins: The Economics of Guardband Placement. ITC 1993: 218-225
1992
3 Richard H. Williams, R. Glenn Wagner, Charles F. Hawkins: Testing Errors: Data and Calculations in an IC Manufacturing Process. ITC 1992: 352-361
2 Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins: Economic Impact of Type I Test Errors at System and Board Levels. ITC 1992: 444-452
1991
1 Charles F. Hawkins, Richard H. Williams: EE Curriculum - Continuous Process Improvement? ITC 1991: 1118

Coauthor Index

1Charles F. Hawkins [1] [2] [3] [4]
2Christopher L. Henderson [2]
3R. Glenn Wagner [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)