| 2004 |
|---|
| 6 | EE | Pamela S. Gillis,
Francis Woytowich,
Andrew Ferko,
Kevin McCauley:
Low Overhead Delay Testing of ASICS.
ITC 2004: 534-542 |
| 1998 |
|---|
| 5 | EE | Pamela S. Gillis,
Francis Woytowich,
Kevin McCauley,
Ulrich Baur:
Delay test of chip I/Os using LSSD boundary scan.
ITC 1998: 83-90 |
| 1996 |
|---|
| 4 | | Pamela S. Gillis,
Tom S. Guzowski,
Brion L. Keller,
Randal H. Kerr:
Test methodologies and design automation for IBM ASICs.
IBM Journal of Research and Development 40(4): 461-474 (1996) |
| 1991 |
|---|
| 3 | | Robert W. Bassett,
Pamela S. Gillis,
John J. Shushereba:
High-Density CMOS Multichip-Module Testing and Diagnosis.
ITC 1991: 530-539 |
| 1990 |
|---|
| 2 | EE | Robert W. Bassett,
Barry J. Butkus,
Stephen L. Dingle,
Marc R. Faucher,
Pamela S. Gillis,
Jeannie H. Panner,
John G. Petrovick,
Donald L. Wheater:
Low-Cost Testing of High-Density Logic Components.
IEEE Design & Test of Computers 7(2): 15-28 (1990) |
| 1989 |
|---|
| 1 | | Robert W. Bassett,
Barry J. Butkus,
Stephen L. Dingle,
Marc R. Faucher,
Pamela S. Gillis,
Jeannie H. Panner,
John G. Petrovick,
Donald L. Wheater:
Low Cost Testing of High Density Logic Components.
ITC 1989: 550-557 |
