Steven D. Millman

1994
5	EE	Steven D. Millman: Improving quality: Yield versus test coverage. J. Electronic Testing 5(2-3): 253-261 (1994)
1993
4		Jan Moorman, Steven D. Millman: Visualizing Test Information: A Novel Approach for Improving Testability. ITC 1993: 149-156
1991
3		Steven D. Millman, Edward J. McCluskey: Bridging, Transition, and Stuck-Open Faults in Self-Testing CMOS Checkers. FTCS 1991: 154-161
2		Steven D. Millman, James P. Garvey Sr.: An Accurate Bridging Fault Test Pattern Generator. ITC 1991: 411-418
1988
1		Steven D. Millman, Edward J. McCluskey: Detecting Bridging Faults with Stuck-at Test Sets. ITC 1988: 773-783

Coauthor Index

1	Edward J. McCluskey	[1] [3]
2	Jan Moorman	[4]
3	James P. Garvey Sr.	[2]

Colors in the list of coauthors