Anne Meixner

2004
6	EE	T. M. Mak, Mike Tripp, Anne Meixner: Testing Gbps Interfaces without a Gigahertz Tester. IEEE Design & Test of Computers 21(4): 278-286 (2004)
2003
5	EE	Mike Tripp, T. M. Mak, Anne Meixner: Elimination of Traditional Functional Testing of Interface Timings at Intel. ITC 2003: 1014-1022
4	EE	Mike Tripp, T. M. Mak, Anne Meixner: Elimination of Traditional Functional Testing of Interface Timings at Intel. ITC 2003: 1448-1456
1997
3		Anne Meixner, Jash Banik: Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. ITC 1997: 1043-1052
1996
2		Anne Meixner, Jash Banik: Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique. ITC 1996: 309-318
1991
1		Anne Meixner, Wojciech Maly: Fault Modeling for the Testing of Mixed Integrated Circuits. ITC 1991: 564-572

Coauthor Index

1	Jash Banik	[2] [3]
2	T. M. Mak	[4] [5] [6]
3	Wojciech Maly	[1]
4	Mike Tripp	[4] [5] [6]

Colors in the list of coauthors