| |
| 1993 | ||
|---|---|---|
| 5 | EE | Jung-Cheun Lien, Melvin A. Breuer: Test program synthesis for modules and chips having boundary scan. J. Electronic Testing 4(2): 159-180 (1993) |
| 1991 | ||
| 4 | Jung-Cheun Lien, Melvin A. Breuer: Maximal Diagnosis for Wiring Networks. ITC 1991: 96-105 | |
| 3 | EE | Jung-Cheun Lien, Melvin A. Breuer: An optimal scheduling algorithm for testing interconnect using boundary scan. J. Electronic Testing 2(1): 117-130 (1991) |
| 1988 | ||
| 2 | Sandeep K. Gupta, Melvin A. Breuer, Jung-Cheun Lien: Concurrent Control of Multiple BIT Structures. ITC 1988: 431-442 | |
| 1 | Melvin A. Breuer, Jung-Cheun Lien: A Test and Maintenance Controller for a Module Containing Testable Chips. ITC 1988: 502-513 | |
| 1 | Melvin A. Breuer | [1] [2] [3] [4] [5] |
| 2 | Sandeep K. Gupta | [2] |