| 2006 |
|---|
| 4 | EE | Hirotaka Komoda,
Masaaki Yoshida,
Yoh Yamamoto,
Kouji Iwasaki,
Ikuko Nakatani,
Heiji Watanabe,
Kiyoshi Yasutake:
Novel charge neutralization techniques applicable to wide current range of FIB processing in FIB-SEM combined system.
Microelectronics Reliability 46(12): 2085-2095 (2006) |
| 1997 |
|---|
| 3 | EE | Toshinobu Ono,
Kazuo Wakui,
Hitoshi Hikima,
Yoshiyuki Nakamura,
Masaaki Yoshida:
Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs.
Asian Test Symposium 1997: 122-125 |
| 2 | | Toshiharu Asaka,
Masaaki Yoshida,
Subhrajit Bhattacharya,
Sujit Dey:
H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs.
ITC 1997: 265-274 |
| 1991 |
|---|
| 1 | | Toshinobu Ono,
Masaaki Yoshida:
A Test Generation Method for Sequential Circuits Based on Maximum Utilization of Internal States.
ITC 1991: 75-82 |
