| 2003 |
|---|
| 8 | EE | Wouter Rijckaert,
Frans de Jong:
Board Test Coverage: The Value of Prediction and How to Compare Numbers.
ITC 2003: 1277 |
| 7 | EE | Frans de Jong,
Leon van de Logt:
IEEE P1581: To Live or Let die?
ITC 2003: 1278 |
| 2002 |
|---|
| 6 | EE | Rodger Schuttert,
Frans de Jong,
Ben Kup:
Improved Test Monitor Circuit in Power Pin DfT.
VTS 2002: 345-350 |
| 2000 |
|---|
| 5 | | Frans de Jong,
Ben Kup,
Rodger Schuttert:
Power pin testing: making the test coverage complete.
ITC 2000: 575-584 |
| 1999 |
|---|
| 4 | | Frans de Jong:
SCITT: Back to Basics in Mass Production Testing.
ITC 1999: 1138 |
| 3 | | Alex Biewenga,
Henk D. L. Hollmann,
Frans de Jong,
Maurice Lousberg:
Static component interconnect test technology (SCITT) a new technology for assembly testing.
ITC 1999: 439-448 |
| 1992 |
|---|
| 2 | | Frans de Jong,
Adriaan J. de Lind van Wijngaarden:
Memory Interconnection Test at Board Level.
ITC 1992: 328-337 |
| 1991 |
|---|
| 1 | | Frans de Jong,
Frank van der Heyden:
Testing the Integrity of the Boundary Scan Test Infrastructure.
ITC 1991: 106-112 |
