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Klaus Helmreich

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2001
4 Klaus Helmreich: Test path simulation and characterisation. ITC 2001: 415-423
1996
3 Klaus Helmreich, G. Reinwardt: Virtual Test of Noise and Jitter Parameters. ITC 1996: 461-470
1992
2 R. Scharf, C. Kuntzsch, Klaus Helmreich, Werner Wolz, Klaus D. Müller-Glaser: DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements. ITC 1992: 840-847
1991
1 Klaus Helmreich, Peter Nagel, Werner Wolz, Klaus D. Müller-Glaser: An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. ITC 1991: 256-262

Coauthor Index

1C. Kuntzsch [2]
2Klaus D. Müller-Glaser [1] [2]
3Peter Nagel [1]
4G. Reinwardt [3]
5R. Scharf [2]
6Werner Wolz [1] [2]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)