| |
| 2001 | ||
|---|---|---|
| 4 | Klaus Helmreich: Test path simulation and characterisation. ITC 2001: 415-423 | |
| 1996 | ||
| 3 | Klaus Helmreich, G. Reinwardt: Virtual Test of Noise and Jitter Parameters. ITC 1996: 461-470 | |
| 1992 | ||
| 2 | R. Scharf, C. Kuntzsch, Klaus Helmreich, Werner Wolz, Klaus D. Müller-Glaser: DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements. ITC 1992: 840-847 | |
| 1991 | ||
| 1 | Klaus Helmreich, Peter Nagel, Werner Wolz, Klaus D. Müller-Glaser: An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. ITC 1991: 256-262 | |
| 1 | C. Kuntzsch | [2] |
| 2 | Klaus D. Müller-Glaser | [1] [2] |
| 3 | Peter Nagel | [1] |
| 4 | G. Reinwardt | [3] |
| 5 | R. Scharf | [2] |
| 6 | Werner Wolz | [1] [2] |