N. Ohtsuka
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1991
1
J. Miyamoto
, N. Ohtsuka,
K. Imamiya
,
N. Tomita
,
Y. Iyama
: Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme.
ITC 1991
: 540-547
Coauthor
Index
1
K. Imamiya
[
1
]
2
Y. Iyama
[
1
]
3
J. Miyamoto
[
1
]
4
N. Tomita
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
