Tom Munns

2002
3	EE	John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns: valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. ITC 2002: 1040-1049
1992
2		W. C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns: Implementing 1149.1 on CMOS Microprocessors. ITC 1992: 999-1006
1991
1		W. C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns: Implementing 1149.1 on CMOS Microprocessors. ITC 1991: 879-886

Coauthor Index

1	W. C. Bruce	[1] [2]
2	Michael G. Gallup	[1] [2]
3	John Gatej	[3]
4	Grady Giles	[1] [2]
5	Carol Pyron	[3]
6	Rajesh Raina	[3]
7	Lee Song	[3]