| 2008 |
| 20 | EE | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Full Open Defects in Nanometric CMOS.
VTS 2008: 119-124 |
| 19 | EE | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras:
Experimental Characterization of CMOS Interconnect Open Defects.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 123-136 (2008) |
| 2007 |
| 18 | EE | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS 2007: 145-150 |
| 17 | EE | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS 2007: 158-166 |
| 2006 |
| 16 | | L. Balado,
E. Lupon,
L. García,
Rosa Rodríguez-Montañés,
Joan Figueras:
Lissajous Based Mixed-Signal Testing for N-Observable Signals.
DDECS 2006: 125-130 |
| 2004 |
| 15 | EE | Salvador Manich,
L. García,
L. Balado,
E. Lupon,
Josep Rius,
Rosa Rodríguez-Montañés,
Joan Figueras:
BIST Technique by Equally Spaced Test Vector Sequences.
VTS 2004: 206-216 |
| 14 | EE | Rosa Rodríguez-Montañés,
D. Muñoz,
L. Balado,
Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.
J. Electronic Testing 20(2): 143-153 (2004) |
| 2003 |
| 13 | EE | Doru P. Munteanu,
Víctor Suñé,
Rosa Rodríguez-Montañés,
Juan A. Carrasco:
A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip.
DSN 2003: 563-572 |
| 12 | EE | José Pineda de Gyvez,
Rosa Rodríguez-Montañés:
Threshold Voltage Mismatch (DeltaVT) Fault Modeling.
VTS 2003: 145-150 |
| 2002 |
| 11 | EE | Rosa Rodríguez-Montañés,
D. Muñoz,
L. Balado,
Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.
IOLTW 2002: 99-103 |
| 10 | EE | Marcelino B. Santos,
Isabel C. Teixeira,
João Paulo Teixeira,
Salvador Manich,
Rosa Rodríguez-Montañés,
Joan Figueras:
RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST.
ITC 2002: 814-823 |
| 9 | EE | Rosa Rodríguez-Montañés,
Paul Volf,
José Pineda de Gyvez:
Resistance Characterization for Weak Open Defects.
IEEE Design & Test of Computers 19(5): 18-26 (2002) |
| 1998 |
| 8 | EE | Rosa Rodríguez-Montañés,
Joan Figueras:
Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs.
DATE 1998: 490-494 |
| 7 | EE | Antoni Ferré,
Eugeni Isern,
Josep Rius,
Rosa Rodríguez-Montañés,
Joan Figueras:
IDDQ testing: state of the art and future trends.
Integration 26(1-2): 167-196 (1998) |
| 1997 |
| 6 | EE | Rosa Rodríguez-Montañés,
Joan Figueras:
Bridges in sequential CMOS circuits: current-voltage signatur.
VTS 1997: 68-73 |
| 1996 |
| 5 | EE | Rosa Rodríguez-Montañés,
E. M. J. G. Bruls,
Joan Figueras:
Bridging defects resistance in the metal layer of a CMOS process.
J. Electronic Testing 8(1): 35-46 (1996) |
| 1994 |
| 4 | | Rosa Rodríguez-Montañés,
Joan Figueras:
Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability.
EDAC-ETC-EUROASIC 1994: 356-360 |
| 1992 |
| 3 | | Rosa Rodríguez-Montañés,
Joan Figueras,
Eric Bruls:
Bridging Defects Resistance Measurements in a CMOS Process.
ITC 1992: 892-899 |
| 2 | EE | J. A. Segura,
Víctor H. Champac,
Rosa Rodríguez-Montañés,
Joan Figueras,
J. A. Rubio:
Quiescent current analysis and experimentation of defective CMOS circuits.
J. Electronic Testing 3(4): 337-348 (1992) |
| 1991 |
| 1 | | Rosa Rodríguez-Montañés,
J. A. Segura,
Víctor H. Champac,
Joan Figueras,
J. A. Rubio:
Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS.
ITC 1991: 510-519 |