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1992 | ||
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12 | Sungju Park, Sheldon B. Akers: A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination. ITC 1992: 303-311 | |

11 | EE | Sungju Park, Sheldon B. Akers: Parity bit calculation and test signal compaction for BIST applications. J. Electronic Testing 3(1): 45-52 (1992) |

1991 | ||

10 | Sungju Park, Sheldon B. Akers: Parity Bit Calculation and Test Signal Compaction for BIST Applications. ITC 1991: 1016-1023 | |

1989 | ||

9 | Sheldon B. Akers, Winston Jansz: Test Set Embedding in a Built-In Self-Test Environment. ITC 1989: 257-263 | |

8 | Sheldon B. Akers, Balakrishnan Krishnamurthy: A Group-Theoretic Model for Symmetric Interconnection Networks. IEEE Trans. Computers 38(4): 555-566 (1989) | |

1988 | ||

7 | EE | Sheldon B. Akers: A parity bit signature for exhaustive testing. IEEE Trans. on CAD of Integrated Circuits and Systems 7(3): 333-338 (1988) |

1987 | ||

6 | Sheldon B. Akers, Balakrishnan Krishnamurthy, Dov Harel: The Star Graph: An Attractive Alternative to the n-Cube. ICPP 1987: 393-400 | |

5 | Sheldon B. Akers, Balakrishnan Krishnamurthy: On Group Graphs and Their Fault Tolerance. IEEE Trans. Computers 36(7): 885-888 (1987) | |

1986 | ||

4 | Sheldon B. Akers, Balakrishnan Krishnamurthy: : A Group Theoretic Model for Symmetric Interconnection Networks. ICPP 1986: 216-223 | |

3 | Sheldon B. Akers: A Parity Bit Signature for Exhaustive Testing. ITC 1986: 48-53 | |

1984 | ||

2 | Balakrishnan Krishnamurthy, Sheldon B. Akers: On the Complexity of Estimating the Size of a Test Set. IEEE Trans. Computers 33(8): 750-753 (1984) | |

1978 | ||

1 | Sheldon B. Akers: Binary Decision Diagrams. IEEE Trans. Computers 27(6): 509-516 (1978) |

1 | Dov Harel | [6] |

2 | Winston Jansz | [9] |

3 | Balakrishnan Krishnamurthy | [2] [4] [5] [6] [8] |

4 | Sungju Park | [10] [11] [12] |