| 2003 |
|---|
| 12 | EE | Magdy S. Abadir,
Jing Zeng,
Carol Pyron,
Juhong Zhu:
Automated Test Model Generation from Switch Level Custom Circuits.
Asian Test Symposium 2003: 184-189 |
| 2002 |
|---|
| 11 | EE | John Gatej,
Lee Song,
Carol Pyron,
Rajesh Raina,
Tom Munns:
valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits.
ITC 2002: 1040-1049 |
| 10 | EE | Carol Pyron:
Scan and BIST Can Almost Achieve Test Quality Levels.
ITC 2002: 1196 |
| 9 | EE | Carol Pyron,
Rekha Bangalore,
Dawit Belete,
Jason Goertz,
Ashutosh Razdan,
Denise Younger:
Silicon Symptoms to Solutions: Applying Design for Debug Techniques.
ITC 2002: 664-672 |
| 2000 |
|---|
| 8 | EE | Nandu Tendolkar,
Robert F. Molyneaux,
Carol Pyron,
Rajesh Raina:
At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor.
VTS 2000: 3-8 |
| 1999 |
|---|
| 7 | | Carol Pyron,
Mike Alexander,
James Golab,
George Joos,
Bruce Long,
Robert F. Molyneaux,
Rajesh Raina,
Nandu Tendolkar:
DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor.
ITC 1999: 137-146 |
| 1998 |
|---|
| 6 | EE | Carol Pyron,
Javier Prado,
James Golab:
Test Strategy for the PowerPC 750 Microprocessor.
IEEE Design & Test of Computers 15(3): 90-97 (1998) |
| 1997 |
|---|
| 5 | | Carol Pyron,
Javier Prado,
James Golab:
Next-Generation PowerPCTM Microprocessor Test Strategy Improvements.
ITC 1997: 414-423 |
| 1995 |
|---|
| 4 | | Carol Pyron,
W. C. Bruce:
Implementing 1149.1 in the PowerPCTM RISC Microprocessor Family.
ITC 1995: 844-850 |
| 1992 |
|---|
| 3 | | Michael G. Wahl,
Carol Pyron:
EDIF Test - The Upcoming Standard for Test Data Transfers.
ITC 1992: 453-458 |
| 1991 |
|---|
| 2 | | Carol Pyron:
Representing Boundary Scan Tests with the EDIF Test View.
ITC 1991: 1105 |
| 1989 |
|---|
| 1 | | Carol Pyron,
Rex Sallade:
CAE Functionality for Verification of Diagnostic Programs.
ITC 1989: 94-102 |
