| 2002 |
|---|
| 8 | EE | Grady Giles:
Is Scan (Alone) Sufficient to Test Today?s Microprocessors? Not Quite, but We Can?t Get the Job Done Without It.
ITC 2002: 1197 |
| 2000 |
|---|
| 7 | | Don E. Ross,
Tim Wood,
Grady Giles:
Conversion of small functional test sets of nonscan blocks to scan patterns.
ITC 2000: 691-700 |
| 1998 |
|---|
| 6 | EE | Dale Amason,
Alfred L. Crouch,
Renny Eisele,
Grady Giles,
Michael Mateja:
Test Development for Second-Generation ColdFire Microprocessors.
IEEE Design & Test of Computers 15(3): 70-76 (1998) |
| 1997 |
|---|
| 5 | | Michael Mateja,
Alfred L. Crouch,
Renny Eisele,
Grady Giles,
Dale Amason:
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.
ITC 1997: 424-432 |
| 1992 |
|---|
| 4 | | W. C. Bruce,
Michael G. Gallup,
Grady Giles,
Tom Munns:
Implementing 1149.1 on CMOS Microprocessors.
ITC 1992: 999-1006 |
| 1991 |
|---|
| 3 | | W. C. Bruce,
Michael G. Gallup,
Grady Giles,
Tom Munns:
Implementing 1149.1 on CMOS Microprocessors.
ITC 1991: 879-886 |
| 1986 |
|---|
| 2 | | Grady Giles,
Kenneth Scheuer:
Testability Features of the MC68851 PMMU.
ITC 1986: 408-411 |
| 1985 |
|---|
| 1 | | Grady Giles,
Craig Hunter:
A Methodology for Testing Content Addressable Memories.
ITC 1985: 471-475 |
