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ISQED 2004: San Jose, California, USA

5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. IEEE Computer Society 2004, ISBN 0-7695-2093-6 BibTeX

ISQED Tutorials: Compact Modeling and Analysis for Nanometer-Scale CMOS Design

ISQED Panel Discussion EP1

Plenary Session I

Physical Design Migration

Device and Memory

Poster Session

ISQED Luncheon Speech

Topics in Printability

Package Design and Interaction

Test Generation and Application

Modeling and Simulations of Electromigration and Eletromagnetic Effect

Interconnect: Capacitance Extraction and Delay Calculation

Substrate Noise: Analysis and Prevention

ISQED Panel Discussion EP2

Plenary Session II

Interconnect Delay and Coupling

Analysis of Variations

Layout and Design Techniques for Quality and Reliability

Analog Testing

Low Power Design


DFM Design Techniques

Delay Test Issues

Circuit Design Trends in DSM

Copyright © Sat May 16 23:26:17 2009 by Michael Ley (ley@uni-trier.de)