Dimitris Bakalis

2009
18	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: Efficient partial scan cell gating for low-power scan-based testing. ACM Trans. Design Autom. Electr. Syst. 14(2): (2009)
2006
17	EE	Dimitris Bakalis, K. Adaos, D. Lymperopoulos, Maciej Bellos, Haridimos T. Vergos, George Alexiou, Dimitris Nikolos: A core generator for arithmetic cores and testing structures with a network interface. Journal of Systems Architecture 52(1): 1-12 (2006)
2004
16	EE	Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos, Xrysovalantis Kavousianos: Low Power Testing by Test Vector Ordering with Vector Repetition. ISQED 2004: 205-210
15	EE	Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos: Scan Cell Ordering for Low Power BIST. ISVLSI 2004: 281-284
14	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Maciej Bellos, Dimitris Nikolos: An Efficient Test Vector Ordering Method for Low Power Testing. ISVLSI 2004: 285-288
2002
13	EE	Giorgos Dimitrakopoulos, Dimitris Nikolos, Dimitris Bakalis: Bit-Serial Test Pattern Generation by an Accumulator Behaving as a Non-Linear Feedback Shift Register. IOLTW 2002: 152-157
12	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: An Efficient Seeds Selection Method for LFSR-Based Test-per-Clock BIST. ISQED 2002: 261-266
11	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos, Spyros Tragoudas: A new built-in TPG method for circuits with random patternresistant faults. IEEE Trans. on CAD of Integrated Circuits and Systems 21(7): 859-866 (2002)
10	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST. J. Electronic Testing 18(3): 315-332 (2002)
9	EE	Dimitris Bakalis, Emmanouil Kalligeros, Dimitris Nikolos, Haridimos T. Vergos, George Alexiou: On the design of low power BIST for multipliers with Booth encoding and Wallace tree summation. Journal of Systems Architecture 48(4-5): 125-135 (2002)
2001
8	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: A novel reseeding technique for accumulator-based test pattern generation. ACM Great Lakes Symposium on VLSI 2001: 7-12
7	EE	Dimitris Bakalis, K. Adaos, George Alexiou, Dimitris Nikolos, D. Lymperopoulos: EUDOXUS: A WWW-based Generator of Reusable Arithmetic Cores. IEEE International Workshop on Rapid System Prototyping 2001: 182-187
6	EE	Stanislaw J. Piestrak, Dimitris Bakalis, Xrysovalantis Kavousianos: On the Design of Self-Testing Checkers for Modified Berger Codes. IOLTW 2001: 153-157
5	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: A New Reseeding Technique for LFSR-Based Test Pattern Generation. IOLTW 2001: 80-86
4	EE	Dimitris Bakalis, Dimitris Nikolos, Haridimos T. Vergos, Xrysovalantis Kavousianos: On Accumulator-Based Bit-Serial Test Response Compaction Schemes. ISQED 2001: 350-
2000
3	EE	Dimitris Bakalis, Dimitris Nikolos, George Alexiou, Emmanouil Kalligeros, Haridimos T. Vergos: Low Power BIST for Wallace Tree-Based Fast Multipliers. ISQED 2000: 433-438
2		Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: Test response compaction by an accumulator behaving as a multiple input non-linear feedback shift register. ITC 2000: 804-811
1999
1	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Haridimos T. Vergos, Dimitris Nikolos, George Alexiou: Low Power Dissipation in BIST Schemes for Modified Booth Multipliers. DFT 1999: 121-129

Coauthor Index

1	K. Adaos	[7] [17]
2	George Alexiou (G. Ph. Alexiou)	[1] [3] [7] [9] [17]
3	Maciej Bellos	[14] [15] [16] [17]
4	Giorgos Dimitrakopoulos	[13]
5	Emmanouil Kalligeros	[3] [5] [9] [10] [12]
6	Xrysovalantis Kavousianos	[1] [2] [4] [5] [6] [8] [10] [11] [12] [14] [16] [18]
7	D. Lymperopoulos	[7] [17]
8	Dimitris Nikolos	[1] [2] [3] [4] [5] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18]
9	Stanislaw J. Piestrak	[6]
10	Spyros Tragoudas	[11]
11	Haridimos T. Vergos	[1] [3] [4] [9] [17]