| 2006 |
|---|
| 8 | EE | Joseph B. Bernstein,
Moshe Gurfinkel,
Xiaojun Li,
Jörg Walters,
Yoram Shapira,
Michael Talmor:
Electronic circuit reliability modeling.
Microelectronics Reliability 46(12): 1957-1979 (2006) |
| 2005 |
|---|
| 7 | EE | Xiaojun Li,
Bing Huang,
J. Qin,
X. Zhang,
Michael Talmor,
Z. Gur,
Joseph B. Bernstein:
Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE.
ISQED 2005: 382-389 |
| 6 | EE | Xiaojun Li,
Joerg D. Walter,
Joseph B. Bernstein:
Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature.
ISQED 2005: 496-502 |
| 5 | EE | Bing Huang,
Xiaojun Li,
Ming Li,
Joseph B. Bernstein,
Carol Smidts:
Study of the Impact of Hardware Fault on Software Reliability.
ISSRE 2005: 63-72 |
| 4 | EE | John S. Suehle,
B. Zhu,
Y. Chen,
Joseph B. Bernstein:
Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides.
Microelectronics Reliability 45(3-4): 419-426 (2005) |
| 2004 |
|---|
| 3 | EE | Hu Huang,
Joseph B. Bernstein,
Martin Peckerar,
Ji Luo:
Combined Channel Segmentation and Buffer Insertion for Routability and Performance Improvement of Field.
ICCD 2004: 490-495 |
| 2 | EE | Ji Luo,
Joseph B. Bernstein,
J. Ari Tuchman,
Hu Huang,
Kuan-Jung Chung,
Anthony L. Wilson:
A High Performance Radiation-Hard Field Programmable Analog Array .
ISQED 2004: 522-527 |
| 2002 |
|---|
| 1 | EE | Zhuo Gao,
Ji Luo,
Hu Huang,
Wei Zhang,
Joseph B. Bernstein:
Reliable Laser Programmable Gate Array Technology.
ISQED 2002: 252-256 |
