dblp.uni-trier.dewww.uni-trier.de

Chee Lip Gan

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2007
3EESyed M. Alam, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel: Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations. Microelectronics Journal 38(4-5): 463-473 (2007)
2005
2EESyed M. Alam, Frank L. Wei, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel: Electromigration Reliability Comparison of Cu and Al Interconnects. ISQED 2005: 303-308
2004
1EESyed M. Alam, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel: Circuit Level Reliability Analysis of Cu Interconnects. ISQED 2004: 238-243

Coauthor Index

1Syed M. Alam [1] [2] [3]
2Carl V. Thompson [1] [2] [3]
3Donald E. Troxel [1] [2] [3]
4Frank L. Wei [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)