Valeriy Sukharev

2009
3	EE	Valeriy Sukharev, Ara Markosian, Armen Kteyan, Levon Manukyan, Nikolay Khachatryan, Jun-Ho Choy, Hasmik Lazaryan, Henrik Hovsepyan, Seiji Onoue, Takuo Kikuchi, Tetsuya Kamigaki: Control of design specific variation in etch-assisted via pattern transfer by means of full-chip simulation. ISQED 2009: 156-161
2005
2	EE	Valeriy Sukharev: Physically based simulation of electromigration-induced degradation mechanisms in dual-inlaid copper interconnects. IEEE Trans. on CAD of Integrated Circuits and Systems 24(9): 1326-1335 (2005)
2004
1	EE	Valeriy Sukharev: Physically-Based Simulation of Electromigration Induced Failures in Copper Dual-Damascene Interconnect. ISQED 2004: 225-231

Coauthor Index

1	Jun-Ho Choy	[3]
2	Henrik Hovsepyan	[3]
3	Tetsuya Kamigaki	[3]
4	Nikolay Khachatryan	[3]
5	Takuo Kikuchi	[3]
6	Armen Kteyan	[3]
7	Hasmik Lazaryan	[3]
8	Levon Manukyan	[3]
9	Ara Markosian	[3]
10	Seiji Onoue	[3]