2005 |
13 | EE | Jing Wang,
Xiang Lu,
Wangqi Qiu,
Ziding Yue,
Steve Fancler,
Weiping Shi,
D. M. H. Walker:
Static Compaction of Delay Tests Considering Power Supply Noise.
VTS 2005: 235-240 |
12 | EE | Xiang Lu,
Zhuo Li,
Wangqi Qiu,
D. M. H. Walker,
Weiping Shi:
Longest-path selection for delay test under process variation.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1924-1929 (2005) |
2004 |
11 | EE | Xiang Lu,
Zhuo Li,
Wangqi Qiu,
D. M. H. Walker,
Weiping Shi:
Longest path selection for delay test under process variation.
ASP-DAC 2004: 98-103 |
10 | EE | Xiang Lu,
Zhuo Li,
Wangqi Qiu,
D. M. H. Walker,
Weiping Shi:
PARADE: PARAmetric Delay Evaluation under Process Variation.
ISQED 2004: 276-280 |
9 | EE | Wangqi Qiu,
Jing Wang,
D. M. H. Walker,
Divya Reddy,
Zhuo Li,
Weiping Shi,
Hari Balachandran:
K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits.
ITC 2004: 223-231 |
8 | EE | Xiang Lu,
Zhuo Li,
Wangqi Qiu,
D. M. H. Walker,
Weiping Shi:
A Circuit Level Fault Model for Resistive Shorts of MOS Gate Oxide.
MTV 2004: 97-102 |
7 | EE | Wangqi Qiu,
Weiping Shi:
Minimum moment Steiner trees.
SODA 2004: 488-495 |
6 | EE | Wangqi Qiu,
Xiang Lu,
Jing Wang,
Zhuo Li,
D. M. H. Walker,
Weiping Shi:
A Statistical Fault Coverage Metric for Realistic Path Delay Faults.
VTS 2004: 37-42 |
2003 |
5 | EE | Wangqi Qiu,
Xiang Lu,
Zhuo Li,
D. M. H. Walker,
Weiping Shi:
CodSim -- A Combined Delay Fault Simulator.
DFT 2003: 79- |
4 | EE | Wangqi Qiu,
D. M. H. Walker:
An Efficient Algorithm for Finding the K Longest Testable Paths Through Each Gate in a Combinational Circuit.
ITC 2003: 592-601 |
3 | EE | Wangqi Qiu,
D. M. H. Walker:
Testing the Path Delay Faults of ISCAS85 Circuit c6288.
MTV 2003: 19- |
2 | EE | Zhuo Li,
Xiang Lu,
Wangqi Qiu,
Weiping Shi,
D. M. H. Walker:
A Circuit Level Fault Model for Resistive Opens and Bridges.
VTS 2003: 379-384 |
1 | EE | Zhuo Li,
Xiang Lu,
Wangqi Qiu,
Weiping Shi,
D. M. H. Walker:
A circuit level fault model for resistive bridges.
ACM Trans. Design Autom. Electr. Syst. 8(4): 546-559 (2003) |