| 2008 |
|---|
| 5 | EE | Hangkyu Lee,
Irith Pomeranz,
Sudhakar M. Reddy:
On Complete Functional Broadside Tests for Transition Faults.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(3): 583-587 (2008) |
| 2006 |
|---|
| 4 | EE | Hangkyu Lee,
Suriyaprakash Natarajan,
Srinivas Patil,
Irith Pomeranz:
Selecting High-Quality Delay Tests for Manufacturing Test and Debug.
DFT 2006: 59-70 |
| 3 | EE | Hangkyu Lee,
Irith Pomeranz,
Sudhakar M. Reddy:
A Test Generation Procedure for Avoiding the Detection of Functionally Redundant Transition Faults.
VTS 2006: 294-299 |
| 2004 |
|---|
| 2 | EE | Hangkyu Lee,
Irith Pomeranz,
Sudhakar M. Reddy:
Scan BIST Targeting Transition Faults Using a Markov Source.
ISQED 2004: 497-502 |
| 1999 |
|---|
| 1 | EE | Hangkyu Lee,
Sungho Kang:
A New Weight Set Generation Algorithm for Weighted Random Pattern Generation.
ICCD 1999: 160-165 |
