H. Puchner

2004
2	EE	Y. Z. Xu, O. Pohland, C. Cai, H. Puchner: Leakage Increase of Narrow and Short BCPMOS. ISQED 2004: 51-54
2001
1		H. Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti: Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectronics Reliability 41(9-10): 1319-1324 (2001)

Coauthor Index

1	C. Cai	[2]
2	R. Castagnetti	[1]
3	F. Duan	[1]
4	W. Kong	[1]
5	Y.-C. Liu	[1]
6	O. Pohland	[2]
7	Y. Z. Xu	[2]

Colors in the list of coauthors