| 2005 |
|---|
| 9 | EE | Manidip Sengupta,
Sharad Saxena,
Lidia Daldoss,
Glen Kramer,
Sean Minehane,
Jianjun Cheng:
Application-specific worst case corners using response surfaces and statistical models.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(9): 1372-1380 (2005) |
| 8 | EE | Maxim Ershov,
Sharad Saxena,
Sean Minehane,
P. Clifton,
Mark Redford,
R. Lindley,
H. Karbasi,
S. Graves,
S. Winters:
Degradation dynamics, recovery, and characterization of negative bias temperature instability.
Microelectronics Reliability 45(1): 99-105 (2005) |
| 2004 |
|---|
| 7 | EE | Manidip Sengupta,
Sharad Saxena,
Lidia Daldoss,
Glen Kramer,
Sean Minehane,
Jianjun Cheng:
Application Specific Worst Case Corners Using Response Surfaces and Statistical Models.
ISQED 2004: 351-356 |
| 2002 |
|---|
| 6 | EE | Carlo Guardiani,
Patrick McNamara,
Lidia Daldoss,
Sharad Saxena,
Stefano Zanella,
Wei Xiang,
Suli Liu:
Analog IP Testing: Diagnosis and Optimization.
DATE 2002: 192-196 |
| 2000 |
|---|
| 5 | EE | Carlo Guardiani,
Sharad Saxena,
Patrick McNamara,
Phillip Schumaker,
Dale Coder:
An asymptotically constant, linearly bounded methodology for the statistical simulation of analog circuits including component mismatch effects.
DAC 2000: 15-18 |
| 1999 |
|---|
| 4 | EE | Marko P. Chew,
Sharad Saxena,
Thomas F. Cobourn,
Purnendu K. Mozumder,
Andrzej J. Strojwas:
A New Methodology for Concurrent Technology Development and Cell Library Optimization.
VLSI Design 1999: 18-25 |
| 1991 |
|---|
| 3 | | Sharad Saxena:
On the Effect of Instance Representation on Generalization.
ML 1991: 198-202 |
| 1990 |
|---|
| 2 | | Richard C. Yee,
Sharad Saxena,
Paul E. Utgoff,
Andrew G. Barto:
Explaining Temporal Differences to Create Useful Concepts for Evaluating States.
AAAI 1990: 882-888 |
| 1989 |
|---|
| 1 | | Sharad Saxena:
Evaluating alternative Instance Representations.
ML 1989: 465-468 |
