Wen-Yi Chen

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2004

1 EE Ming-Dou Ker, Wen-Yi Chen: Design to Avoid the Over-Gate-Driven Effect on ESD Protection Circuits in Deep-Submicron CMOS Processes. ISQED 2004: 445-450

2004
1	EE	Ming-Dou Ker, Wen-Yi Chen: Design to Avoid the Over-Gate-Driven Effect on ESD Protection Circuits in Deep-Submicron CMOS Processes. ISQED 2004: 445-450

Coauthor Index

1 Ming-Dou Ker [1]