Wen-Yi Chen
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2004
1
EE
Ming-Dou Ker
, Wen-Yi Chen: Design to Avoid the Over-Gate-Driven Effect on ESD Protection Circuits in Deep-Submicron CMOS Processes.
ISQED 2004
: 445-450
Coauthor
Index
1
Ming-Dou Ker
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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