| 2005 |
|---|
| 3 | EE | Manidip Sengupta,
Sharad Saxena,
Lidia Daldoss,
Glen Kramer,
Sean Minehane,
Jianjun Cheng:
Application-specific worst case corners using response surfaces and statistical models.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(9): 1372-1380 (2005) |
| 2 | EE | Maxim Ershov,
Sharad Saxena,
Sean Minehane,
P. Clifton,
Mark Redford,
R. Lindley,
H. Karbasi,
S. Graves,
S. Winters:
Degradation dynamics, recovery, and characterization of negative bias temperature instability.
Microelectronics Reliability 45(1): 99-105 (2005) |
| 2004 |
|---|
| 1 | EE | Manidip Sengupta,
Sharad Saxena,
Lidia Daldoss,
Glen Kramer,
Sean Minehane,
Jianjun Cheng:
Application Specific Worst Case Corners Using Response Surfaces and Statistical Models.
ISQED 2004: 351-356 |
