Xrysovalantis Kavousianos

2009
30	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: Efficient partial scan cell gating for low-power scan-based testing. ACM Trans. Design Autom. Electr. Syst. 14(2): (2009)
2008
29	EE	V. Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros: State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores. DATE 2008: 474-479
28	EE	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains. IEEE Trans. VLSI Syst. 16(7): 926-931 (2008)
27	EE	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1333-1338 (2008)
2007
26	EE	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Optimal Selective Huffman Coding for Test-Data Compression. IEEE Trans. Computers 56(8): 1146-1152 (2007)
25	EE	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores. IEEE Trans. on CAD of Integrated Circuits and Systems 26(6): 1070-1083 (2007)
2006
24	EE	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos: Efficient test-data compression for IP cores using multilevel Huffman coding. DATE 2006: 1033-1038
23	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: Efficient Multiphase Test Set Embedding for Scan-based Testing. ISQED 2006: 433-438
2005
22	EE	Emmanouil Kalligeros, D. Kaseridis, Xrysovalantis Kavousianos, Dimitris Nikolos: Reseeding-Based Test Set Embedding with Reduced Test Sequences. ISQED 2005: 226-231
2004
21	EE	Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos, Xrysovalantis Kavousianos: Low Power Testing by Test Vector Ordering with Vector Repetition. ISQED 2004: 205-210
20	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Maciej Bellos, Dimitris Nikolos: An Efficient Test Vector Ordering Method for Low Power Testing. ISVLSI 2004: 285-288
19	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: Multiphase BIST: a new reseeding technique for high test-data compression. IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1429-1446 (2004)
2003
18	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: A highly regular multi-phase reseeding technique for scan-based BIST. ACM Great Lakes Symposium on VLSI 2003: 295-298
17	EE	Giorgos Dimitrakopoulos, Xrysovalantis Kavousianos, Dimitris Nikolos: Virtual-scan: a novel approach for software-based self-testing of microprocessors. ISCAS (5) 2003: 237-240
16		Maciej Bellos, Xrysovalantis Kavousianos, Dimitris Nikolos, Dimitri Kagaris: DV-TSE: Difference Vector Based Test Set Embedding. VLSI-SOC 2003: 343-
2002
15	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos: A ROMless LFSR Reseeding Scheme for Scan-based BIST. Asian Test Symposium 2002: 206-
14	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: An Efficient Seeds Selection Method for LFSR-Based Test-per-Clock BIST. ISQED 2002: 261-266
13	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos, Spyros Tragoudas: A new built-in TPG method for circuits with random patternresistant faults. IEEE Trans. on CAD of Integrated Circuits and Systems 21(7): 859-866 (2002)
12	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST. J. Electronic Testing 18(3): 315-332 (2002)
2001
11	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: A novel reseeding technique for accumulator-based test pattern generation. ACM Great Lakes Symposium on VLSI 2001: 7-12
10	EE	Stanislaw J. Piestrak, Dimitris Bakalis, Xrysovalantis Kavousianos: On the Design of Self-Testing Checkers for Modified Berger Codes. IOLTW 2001: 153-157
9	EE	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: A New Reseeding Technique for LFSR-Based Test Pattern Generation. IOLTW 2001: 80-86
8	EE	Dimitris Bakalis, Dimitris Nikolos, Haridimos T. Vergos, Xrysovalantis Kavousianos: On Accumulator-Based Bit-Serial Test Response Compaction Schemes. ISQED 2001: 350-
2000
7		Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos: Test response compaction by an accumulator behaving as a multiple input non-linear feedback shift register. ITC 2000: 804-811
1999
6	EE	Xrysovalantis Kavousianos, Dimitris Bakalis, Haridimos T. Vergos, Dimitris Nikolos, George Alexiou: Low Power Dissipation in BIST Schemes for Modified Booth Multipliers. DFT 1999: 121-129
5	EE	Xrysovalantis Kavousianos, Dimitris Nikolos: Modular TSC Checkers for Bose-Lin and Bose Codes. VTS 1999: 354-360
4	EE	Xrysovalantis Kavousianos, Dimitris Nikolos, G. Foukarakis, T. Gnardellis: New efficient totally self-checking Berger code checkers. Integration 28(1): 101-118 (1999)
1998
3	EE	Xrysovalantis Kavousianos, Dimitris Nikolos: Novel Single and Double Output TSC Berger Code Checkers. VTS 1998: 348-353
1997
2	EE	Xrysovalantis Kavousianos, Dimitris Nikolos, G. Sidiropoulos: Design of Compact and High speed, Totally Self Checking CMOS Checkers for m-out-of-n Codes. DFT 1997: 128-136
1	EE	Xrysovalantis Kavousianos, Dimitris Nikolos: Self-exercising self testing k-order comparators. VTS 1997: 216-221

Coauthor Index

1	George Alexiou (G. Ph. Alexiou)	[6]
2	Dimitris Bakalis	[6] [7] [8] [9] [10] [11] [12] [13] [14] [20] [21] [30]
3	Maciej Bellos	[16] [20] [21]
4	Giorgos Dimitrakopoulos	[17]
5	G. Foukarakis	[4]
6	T. Gnardellis	[4]
7	Dimitrios Kagaris (Dimitri Kagaris)	[16]
8	Emmanouil Kalligeros	[9] [12] [14] [15] [18] [19] [22] [23] [24] [25] [26] [27] [28] [29]
9	D. Kaseridis	[22]
10	Dimitris Nikolos	[1] [2] [3] [4] [5] [6] [7] [8] [9] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [30]
11	Stanislaw J. Piestrak	[10]
12	G. Sidiropoulos	[2]
13	V. Tenentes	[29]
14	Spyros Tragoudas	[13]
15	Haridimos T. Vergos	[6] [8]