| 2005 |
|---|
| 4 | EE | Manidip Sengupta,
Sharad Saxena,
Lidia Daldoss,
Glen Kramer,
Sean Minehane,
Jianjun Cheng:
Application-specific worst case corners using response surfaces and statistical models.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(9): 1372-1380 (2005) |
| 2004 |
|---|
| 3 | EE | Manidip Sengupta,
Sharad Saxena,
Lidia Daldoss,
Glen Kramer,
Sean Minehane,
Jianjun Cheng:
Application Specific Worst Case Corners Using Response Surfaces and Statistical Models.
ISQED 2004: 351-356 |
| 2002 |
|---|
| 2 | EE | Carlo Guardiani,
Patrick McNamara,
Lidia Daldoss,
Sharad Saxena,
Stefano Zanella,
Wei Xiang,
Suli Liu:
Analog IP Testing: Diagnosis and Optimization.
DATE 2002: 192-196 |
| 1999 |
|---|
| 1 | EE | Lidia Daldoss,
P. Gubian,
Michele Quarantelli:
Transient sensitivity computation in circuit simulation.
ISCAS (6) 1999: 302-305 |
