| 2008 |
|---|
| 12 | EE | Achintya Halder,
Soumendu Bhattacharya,
Abhijit Chatterjee:
System-Level Specification Testing Of Wireless Transceivers.
IEEE Trans. VLSI Syst. 16(3): 263-276 (2008) |
| 2006 |
|---|
| 11 | EE | Achintya Halder,
Abhijit Chatterjee:
Low-Cost Production Testing of Wireless Transmitters.
VLSI Design 2006: 437-442 |
| 2005 |
|---|
| 10 | EE | Achintya Halder,
Abhijit Chatterjee:
Low-cost Production Test of BER for Wireless Receivers.
Asian Test Symposium 2005: 64-69 |
| 9 | EE | Achintya Halder,
Soumendu Bhattacharya,
Ganesh Srinivasan,
Abhijit Chatterjee:
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.
VLSI Design 2005: 289-294 |
| 8 | EE | Achintya Halder,
Abhijit Chatterjee:
Low-Cost Alternate EVM Test for Wireless Receiver Systems.
VTS 2005: 255-260 |
| 7 | EE | Soumendu Bhattacharya,
Achintya Halder,
Ganesh Srinivasan,
Abhijit Chatterjee:
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.
J. Electronic Testing 21(3): 323-339 (2005) |
| 6 | EE | Achintya Halder,
Abhijit Chatterjee:
Test generation for specification test of analog circuits using efficient test response observation methods.
Microelectronics Journal 36(9): 820-832 (2005) |
| 2004 |
|---|
| 5 | EE | Achintya Halder,
Abhijit Chatterjee:
Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits.
ISQED 2004: 401-406 |
| 4 | EE | Soumendu Bhattacharya,
Ganesh Srinivasan,
Sasikumar Cherubal,
Achintya Halder,
Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.
VTS 2004: 229-236 |
| 2003 |
|---|
| 3 | EE | Achintya Halder,
Soumendu Bhattacharya,
Abhijit Chatterjee:
Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models.
ITC 2003: 665-673 |
| 2002 |
|---|
| 2 | EE | Achintya Halder,
Abhijit Chatterjee,
Pramodchandran N. Variyam,
John Ridley:
Measuring Stray Capacitance on Tester Hardware.
VTS 2002: 351-356 |
| 2001 |
|---|
| 1 | EE | Achintya Halder,
Abhijit Chatterjee:
Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits.
Asian Test Symposium 2001: 344- |
