| 2004 |
|---|
| 9 | EE | Marc E. Levitt:
Design for Manufacturing? Design for Yield!!!
ISQED 2004: 19 |
| 1997 |
|---|
| 8 | EE | Sridhar Narayanan,
R. Srinivasan,
R. P. Kunda,
Marc E. Levitt,
Saied Bozorgui-Nesbat:
A fault diagnosis methodology for the UltraSPARCTM-I microprocessor.
ED&TC 1997: 494-500 |
| 7 | EE | Marc E. Levitt:
Designing UltraSparc for Testability.
IEEE Design & Test of Computers 14(1): 10-17 (1997) |
| 6 | | Marc E. Levitt:
Guest Editor's Introduction: Microprocessors Lead the Way in Complex Design.
IEEE Design & Test of Computers 14(1): 8-9 (1997) |
| 1996 |
|---|
| 5 | | Marc E. Levitt:
Formal Verification of the UltraSPARCTM Family of Processors via ATPG Methods.
ITC 1996: 849-856 |
| 1995 |
|---|
| 4 | | Marc E. Levitt,
Srinivas Nori,
Sridhar Narayanan,
G. P. Grewal,
Lynn Youngs,
Anjali Jones,
Greg Billus,
Siva Paramanandam:
Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor.
ITC 1995: 157-166 |
| 1994 |
|---|
| 3 | EE | Jacob A. Abraham,
Sandip Kundu,
Janak H. Patel,
Manuel A. d'Abreu,
Bulent I. Dervisoglu,
Marc E. Levitt,
Hector R. Sucar,
Ron G. Walther:
Microprocessor Testing: Which Technique is Best? (Panel).
DAC 1994: 294 |
| 2 | EE | Marc E. Levitt,
Kaushik Roy,
Jacob A. Abraham:
BiCMOS logic testing.
IEEE Trans. VLSI Syst. 2(2): 241-248 (1994) |
| 1989 |
|---|
| 1 | | Marc E. Levitt,
Jacob A. Abraham:
The Economics of Scan Design.
ITC 1989: 869-874 |
