| |
| 2006 | ||
|---|---|---|
| 2 | EE | Haldun Haznedar, Martin Gall, Vladimir Zolotov, Pon Sung Ku, Chanhee Oh, Rajendran Panda: Impact of stress-induced backflow on full-chip electromigration risk assessment. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1038-1046 (2006) |
| 2004 | ||
| 1 | EE | Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda: A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. ISQED 2004: 232-237 |
| 1 | Amir Grinshpon | [1] |
| 2 | Haldun Haznedar | [1] [2] |
| 3 | Pon Sung Ku | [1] [2] |
| 4 | Chanhee Oh | [1] [2] |
| 5 | Rajendran Panda | [1] [2] |
| 6 | Vladimir Zolotov | [1] [2] |