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Kerry Bernstein

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2007
13EEKerry Bernstein, Paul Andry, Jerome Cann, Philip G. Emma, David Greenberg, Wilfried Haensch, Mike Ignatowski, Steve Koester, John Magerlein, Ruchir Puri, Albert M. Young: Interconnects in the Third Dimension: Design Challenges for 3D ICs. DAC 2007: 562-567
2006
12EEFeng Wang, Yuan Xie, Kerry Bernstein, Yan Luo: Dependability Analysis of Nano-scale FinFET circuits. ISVLSI 2006: 399-404
11EEKerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer: High-performance CMOS variability in the 65-nm regime and beyond. IBM Journal of Research and Development 50(4-5): 433-450 (2006)
10EEScott Hanson, Bo Zhai, Kerry Bernstein, David Blaauw, Andres Bryant, Leland Chang, Koushik K. Das, Wilfried Haensch, Edward J. Nowak, Dennis Sylvester: Ultralow-voltage, minimum-energy CMOS. IBM Journal of Research and Development 50(4-5): 469-490 (2006)
9EEAnna W. Topol, Douglas C. La Tulipe Jr., Leathen Shi, David J. Frank, Kerry Bernstein, Steven E. Steen, Arvind Kumar, Gilbert U. Singco, Albert M. Young, Kathryn W. Guarini, Mei-Kei Ieong: Three-dimensional integrated circuits. IBM Journal of Research and Development 50(4-5): 491-506 (2006)
8EEYuan Xie, Gabriel H. Loh, Bryan Black, Kerry Bernstein: Design space exploration for 3D architectures. JETC 2(2): 65-103 (2006)
2004
7EEKerry Bernstein: Nanometer-Scale CMOS Devices. ISQED 2004: 7
2003
6EEJan M. Rabaey, Dennis Sylvester, David Blaauw, Kerry Bernstein, Jerry Frenkil, Mark Horowitz, Wolfgang Nebel, Takayasu Sakurai, Andrew Yang: Reshaping EDA for power. DAC 2003: 15
5EEKerry Bernstein, Ching-Te Chuang, Rajiv V. Joshi, Ruchir Puri: Design and CAD Challenges in sub-90nm CMOS Technologies. ICCAD 2003: 129-137
4EEKerry Bernstein: Microarchitecture on the MOSFET Diet. MICRO 2003: 3-6
2002
3EER. Rodríguez, James H. Stathis, Barry P. Linder, S. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, A. J. Bhavnagarwala, Salvatore Lombardo: Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectronics Reliability 42(9-11): 1445-1448 (2002)
1996
2EEKerry Bernstein, John E. Bertsch, William F. Clark, John J. Ellis-Monaghan, Larry G. Heller, Edward J. Nowak: Practical performance/power alternatives within an existing CMOS technology generation. ISLPED 1996: 365-370
1995
1 Kerry Bernstein, John E. Bertsch, Lawrence G. Heller, Edward J. Nowak, Francis R. White: Reduced-voltage power/performance optimization of the 3.6-volt PowerPC 601 Microprocessor. IBM Journal of Research and Development 39(1-2): 33-42 (1995)

Coauthor Index

1Paul Andry [13]
2John E. Bertsch [1] [2]
3A. J. Bhavnagarwala [3]
4David Blaauw (David T. Blaauw) [6] [10]
5Bryan Black [8]
6Andres Bryant [10]
7Jerome Cann [13]
8Leland Chang [10]
9Ching-Te Chuang [3] [5]
10William F. Clark [2]
11Koushik K. Das [10]
12John J. Ellis-Monaghan [2]
13Philip G. Emma [13]
14David J. Frank [9] [11]
15Jerry Frenkil [6]
16Anne E. Gattiker [11]
17David Greenberg [13]
18Kathryn W. Guarini [9]
19Wilfried Haensch [10] [11] [13]
20Scott Hanson [10]
21Larry G. Heller [2]
22Lawrence G. Heller [1]
23Mark Horowitz [6]
24Mei-Kei Ieong [9]
25Mike Ignatowski [13]
26Brian L. Ji [11]
27Rajiv V. Joshi [3] [5]
28Steve Koester [13]
29S. Kowalczyk [3]
30Arvind Kumar [9]
31Barry P. Linder [3]
32Gabriel H. Loh [8]
33Salvatore Lombardo [3]
34Yan Luo [12]
35John Magerlein [13]
36Sani R. Nassif [11]
37Wolfgang Nebel [6]
38Gregory A. Northrop [3]
39Edward J. Nowak [1] [2] [10] [11]
40Dale J. Pearson [11]
41Ruchir Puri [5] [13]
42Jan M. Rabaey [6]
43R. Rodríguez [3]
44Norman J. Rohrer [11]
45Takayasu Sakurai [6]
46Leathen Shi [9]
47Gilbert U. Singco [9]
48James H. Stathis [3]
49Steven E. Steen [9]
50Dennis Sylvester [6] [10]
51Anna W. Topol [9]
52Douglas C. La Tulipe Jr. [9]
53Feng Wang [12]
54Francis R. White [1]
55Yuan Xie [8] [12]
56Andrew Yang [6]
57Albert M. Young [9] [13]
58Bo Zhai [10]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)