Kerry Bernstein

2007
13	EE	Kerry Bernstein, Paul Andry, Jerome Cann, Philip G. Emma, David Greenberg, Wilfried Haensch, Mike Ignatowski, Steve Koester, John Magerlein, Ruchir Puri, Albert M. Young: Interconnects in the Third Dimension: Design Challenges for 3D ICs. DAC 2007: 562-567
2006
12	EE	Feng Wang, Yuan Xie, Kerry Bernstein, Yan Luo: Dependability Analysis of Nano-scale FinFET circuits. ISVLSI 2006: 399-404
11	EE	Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer: High-performance CMOS variability in the 65-nm regime and beyond. IBM Journal of Research and Development 50(4-5): 433-450 (2006)
10	EE	Scott Hanson, Bo Zhai, Kerry Bernstein, David Blaauw, Andres Bryant, Leland Chang, Koushik K. Das, Wilfried Haensch, Edward J. Nowak, Dennis Sylvester: Ultralow-voltage, minimum-energy CMOS. IBM Journal of Research and Development 50(4-5): 469-490 (2006)
9	EE	Anna W. Topol, Douglas C. La Tulipe Jr., Leathen Shi, David J. Frank, Kerry Bernstein, Steven E. Steen, Arvind Kumar, Gilbert U. Singco, Albert M. Young, Kathryn W. Guarini, Mei-Kei Ieong: Three-dimensional integrated circuits. IBM Journal of Research and Development 50(4-5): 491-506 (2006)
8	EE	Yuan Xie, Gabriel H. Loh, Bryan Black, Kerry Bernstein: Design space exploration for 3D architectures. JETC 2(2): 65-103 (2006)
2004
7	EE	Kerry Bernstein: Nanometer-Scale CMOS Devices. ISQED 2004: 7
2003
6	EE	Jan M. Rabaey, Dennis Sylvester, David Blaauw, Kerry Bernstein, Jerry Frenkil, Mark Horowitz, Wolfgang Nebel, Takayasu Sakurai, Andrew Yang: Reshaping EDA for power. DAC 2003: 15
5	EE	Kerry Bernstein, Ching-Te Chuang, Rajiv V. Joshi, Ruchir Puri: Design and CAD Challenges in sub-90nm CMOS Technologies. ICCAD 2003: 129-137
4	EE	Kerry Bernstein: Microarchitecture on the MOSFET Diet. MICRO 2003: 3-6
2002
3	EE	R. Rodríguez, James H. Stathis, Barry P. Linder, S. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, A. J. Bhavnagarwala, Salvatore Lombardo: Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectronics Reliability 42(9-11): 1445-1448 (2002)
1996
2	EE	Kerry Bernstein, John E. Bertsch, William F. Clark, John J. Ellis-Monaghan, Larry G. Heller, Edward J. Nowak: Practical performance/power alternatives within an existing CMOS technology generation. ISLPED 1996: 365-370
1995
1		Kerry Bernstein, John E. Bertsch, Lawrence G. Heller, Edward J. Nowak, Francis R. White: Reduced-voltage power/performance optimization of the 3.6-volt PowerPC 601 Microprocessor. IBM Journal of Research and Development 39(1-2): 33-42 (1995)

Coauthor Index

1	Paul Andry	[13]
2	John E. Bertsch	[1] [2]
3	A. J. Bhavnagarwala	[3]
4	David Blaauw (David T. Blaauw)	[6] [10]
5	Bryan Black	[8]
6	Andres Bryant	[10]
7	Jerome Cann	[13]
8	Leland Chang	[10]
9	Ching-Te Chuang	[3] [5]
10	William F. Clark	[2]
11	Koushik K. Das	[10]
12	John J. Ellis-Monaghan	[2]
13	Philip G. Emma	[13]
14	David J. Frank	[9] [11]
15	Jerry Frenkil	[6]
16	Anne E. Gattiker	[11]
17	David Greenberg	[13]
18	Kathryn W. Guarini	[9]
19	Wilfried Haensch	[10] [11] [13]
20	Scott Hanson	[10]
21	Larry G. Heller	[2]
22	Lawrence G. Heller	[1]
23	Mark Horowitz	[6]
24	Mei-Kei Ieong	[9]
25	Mike Ignatowski	[13]
26	Brian L. Ji	[11]
27	Rajiv V. Joshi	[3] [5]
28	Steve Koester	[13]
29	S. Kowalczyk	[3]
30	Arvind Kumar	[9]
31	Barry P. Linder	[3]
32	Gabriel H. Loh	[8]
33	Salvatore Lombardo	[3]
34	Yan Luo	[12]
35	John Magerlein	[13]
36	Sani R. Nassif	[11]
37	Wolfgang Nebel	[6]
38	Gregory A. Northrop	[3]
39	Edward J. Nowak	[1] [2] [10] [11]
40	Dale J. Pearson	[11]
41	Ruchir Puri	[5] [13]
42	Jan M. Rabaey	[6]
43	R. Rodríguez	[3]
44	Norman J. Rohrer	[11]
45	Takayasu Sakurai	[6]
46	Leathen Shi	[9]
47	Gilbert U. Singco	[9]
48	James H. Stathis	[3]
49	Steven E. Steen	[9]
50	Dennis Sylvester	[6] [10]
51	Anna W. Topol	[9]
52	Douglas C. La Tulipe Jr.	[9]
53	Feng Wang	[12]
54	Francis R. White	[1]
55	Yuan Xie	[8] [12]
56	Andrew Yang	[6]
57	Albert M. Young	[9] [13]
58	Bo Zhai	[10]