Pon Sung Ku

2006
2	EE	Haldun Haznedar, Martin Gall, Vladimir Zolotov, Pon Sung Ku, Chanhee Oh, Rajendran Panda: Impact of stress-induced backflow on full-chip electromigration risk assessment. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1038-1046 (2006)
2004
1	EE	Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda: A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. ISQED 2004: 232-237

Coauthor Index

1	Martin Gall	[1] [2]
2	Amir Grinshpon	[1]
3	Haldun Haznedar	[1] [2]
4	Chanhee Oh	[1] [2]
5	Rajendran Panda	[1] [2]
6	Vladimir Zolotov	[1] [2]