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Pon Sung Ku

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2006
2EEHaldun Haznedar, Martin Gall, Vladimir Zolotov, Pon Sung Ku, Chanhee Oh, Rajendran Panda: Impact of stress-induced backflow on full-chip electromigration risk assessment. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1038-1046 (2006)
2004
1EEChanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda: A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. ISQED 2004: 232-237

Coauthor Index

1Martin Gall [1] [2]
2Amir Grinshpon [1]
3Haldun Haznedar [1] [2]
4Chanhee Oh [1] [2]
5Rajendran Panda [1] [2]
6Vladimir Zolotov [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)